Datasheet

6–3
6.4 Electrical Characteristics Over Recommended Operating Conditions
PARAMETER TERMINALS OPERATION TEST CONDITIONS MIN MAX UNIT
V
†
High le el o tp t oltage
3.3 V
I
OH
= –0.5 mA
0.9 V
CC
V
V
OH
†
High-level output voltage
5 V
I
OH
= –2 mA
2.4
V
V
Low level output voltage
3.3 V
I
OL
= 1.5 mA
0.1 V
CC
V
V
OL
Low-level output voltage
5 V
I
OL
= 6 mA
0.55
V
Input terminals
TTL
§
V
I
= V
CC
1
I
IH
‡
High-level input current
Input terminals
PCI V
I
= V
CCP
10
µ
A
I
IH
‡
High level
in ut
current
I/O terminals
¶
VV
10
µA
I/O terminals
¶
V
I
= V
CCP
10
Input terminals
TTL
§
–1
I
IL
‡
Low-level input current
Input terminals
PCI
V
I
= GND
–1
µA
I
IL
‡
Low level
in ut
current
I/O terminals
¶
V
I
GND
–10
µA
I
OZ
High-impedance output current V
O
= V
CCP
or GND ±10 µA
†
V
OH
is not tested on PSERR due to open-drain configuration.
‡
I
IH
and I
IL
are not tested on NO_HSLED dur to its active ourput-only configuration.
§
TTL terminals are 55, 69, 132, 174 for PGF-packaged device; and 49, 63, 120, 159 for PCM-packaged device.
¶
For I/O terminals, the input leakage current includes the off-state output current I
OZ
.