Datasheet
OPA836
OPA2836
SLOS712E –JANUARY 2011–REVISED SEPTEMBER 2013
www.ti.com
SPECIFICATIONS: V
S
= 2.7 V
Test conditions unless otherwise noted: V
S+
= +2.7 V, V
S–
= 0 V, V
OUT
= 1 V
PP
, R
F
= 0 Ω, R
L
= 1 kΩ, G = 1 V/V, Input and
Output Referenced to mid-supply. T
A
= 25°C. Unless otherwise noted
TEST
PARAMETER CONDITIONS MIN TYP MAX UNITS
LEVEL
(1)
DC PERFORMANCE
Open-loop voltage gain (A
OL
) 100 125 dB A
T
A
= 25°C ±65 ±400 A
T
A
= 0°C to 70°C ±680
Input referred offset voltage µV
T
A
= –40°C to 85°C ±760 B
T
A
= –40°C to 125°C ±1060
T
A
= 0°C to 70°C ±1 ±6.2
Input offset voltage drift
(2)
T
A
= –40°C to 85°C ±1 ±6 µV/°C B
T
A
= –40°C to 125°C ±1.1 ±6.6
T
A
= 25°C 300 650 1000 A
T
A
= 0°C to 70°C 190 1400
Input bias current nA
T
A
= –40°C to 85°C 120 1500 B
T
A
= –40°C to 125°C 120 1800
T
A
= 0°C to 70°C ±0.33 ±2
Input bias current drift
(2)
T
A
= –40°C to 85°C ±0.32 ±1.9 nA/°C B
T
A
= –40°C to 125°C ±0.37 ±2.1
T
A
= 25°C ±30 ±180 A
T
A
= 0°C to 70°C ±30 ±200
Input offset current nA
T
A
= –40°C to 85°C ±30 ±215 B
T
A
= –40°C to 125°C ±30 ±240
T
A
= 0°C to 70°C ±77 ±460
Input offset current drift
(2)
T
A
= –40°C to 85°C ±95 ±575 pA/°C B
T
A
= –40°C to 125°C ±100 ±600
INPUT
T
A
= 25°C, <3dB degradation in CMRR limit –0.2 0 V A
Common-mode input range low
T
A
= –40°C to 125°C, <3dB degradation in CMRR limit –0.2 0 V B
T
A
= 25°C, <3dB degradation in CMRR limit 1.5 1.6 V A
Common-mode input range high
T
A
= –40°C to 125°C, <3dB degradation in CMRR limit 1.5 1.6 V B
Input linear operating voltage range T
A
= 25°C, <6dB degradation in THD -0.3 to 1.75 V C
Common-mode rejection ratio 91 114 dB A
Input impedance common mode 200||1.2 kΩ || pF C
Input impedance differential mode 200||1 kΩ || pF C
OUTPUT
T
A
= 25°C, G = 5 0.15 0.2 V A
Linear output voltage low
T
A
= –40°C to 125°C, G = 5 0.15 0.2 V B
T
A
= 25°C, G = 5 2.45 2.5 V A
Linear output voltage high
T
A
= –40°C to 125°C, G = 5 2.45 2.5 V B
Output saturation voltage, High / Low T
A
= 25°C, G = 5 80/40 mV C
T
A
= 25°C ±40 ±45 mA A
Linear output current drive
T
A
= –40°C to 125°C ±40 ±45 mA B
(1) Test levels (all values set by characterization and simulation): (A) 100% tested at 25°C; over temperature limits by characterization and
simulation. (B) Not tested in production; limits set by characterization and simulation. (C) Typical value only for information.
(2) Input Offset Voltage Drift, Input Bias Current Drift, and Input Offset Current Drift are average values calculated by taking data at the end
points, computing the difference, and dividing by the temperature range.
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