Datasheet

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ABSOLUTE MAXIMUM RATINGS
(1)
OPA727 , , OPA2727
OPA4727 , OPA728
SBOS314H – SEPTEMBER 2004 – REVISED APRIL 2007
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
PACKAGE/ORDERING INFORMATION
(1)
PRODUCT PACKAGE-LEAD PACKAGE DESIGNATOR PACKAGE MARKING
Non-Shutdown
MSOP-8 DGK AUE
OPA727
DFN-8 DRB NSF
DFN-8 DRB NSD
OPA2727
SO-8 D O2727A
OPA4727 TSSOP-14 PW OPA4727
Shutdown
MSOP-8 DGK AUF
OPA728
DFN-8 DRB NSG
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com .
OPA727, OPA2727
OPA4727, OPA728 UNIT
Supply Voltage +13.2 V
Voltage
(2)
–0.5 to (V+) + 0.5 V
Signal Input Terminals
Current
(2)
± 10 mA
Output Short-Circuit
(3)
Continuous
Operating Temperature –55 to +125 ° C
Storage Temperature –55 to +150 ° C
Junction Temperature +150 ° C
Human Body Model 2000 V
ESD Rating
Charged Device Model 1000 V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not supported.
(2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails should
be current limited to 10mA or less.
(3) Short-circuit to ground, one amplifier per package.
2
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