Datasheet

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14
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SD
EN
A1
IN0
GND
IN2
V-
IN1
IN3
V+
OUT
FB
A0
GND
Logic
OPA4872
OPA4872
SBOS346C –JUNE 2007–REVISED MARCH 2011 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
Table 1. ORDERING INFORMATION
(1)
SPECIFIED
PACKAGE TEMPERATURE PACKAGE ORDERING TRANSPORT
PRODUCT PACKAGE-LEAD DESIGNATOR RANGE MARKING NUMBER MEDIA, QUANTITY
OPA4872ID Rails, 50
OPA4872 SO-14 D –40°C to +85°C OPA4872
OPA4872IDR Tape and Reel, 2500
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
OPA4872 UNIT
Power supply ±6.5 V
Internal power dissipation See Thermal Characteristics
Input voltage range ±V
S
V
Storage temperature range –65 to +125 °C
Junction temperature (T
J
) +150 °C
Junction temperature: continuous operation, long-term reliability +140 °C
Human body model (HBM) 1300 V
ESD rating Charged device model (CDM) 1000 V
Machine model (MM) 200 V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
PIN CONFIGURATION
D PACKAGE
SO-14
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Product Folder Link(s): OPA4872