Datasheet

OPA365-EP

SLOS735 –AUGUST 2011

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ORDERING INFORMATION

(1)

PACKAGE ORDERABLE PART NUMBER TOP-SIDE MARKING

–55°C to 125°C SOT23 – DBV OPA365AMDBVTEP OUNM

(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

Supply voltage 5.5 V

Signal input terminals, voltage

(2)

(V−) − 0.5V to (V+) + 0.5 V

Signal input terminals, current

(2)

±10 mA

OSC

Output short-circuit duration

(3)(4)

Continuous

Operating temperature −55°C to 125°C

stg

Storage temperature −65°C to 150°C

Junction temperature 150°C

Human Body Model 4000V

ESD Electrostatic discharge rating Charged Device Model 1000V

Machine Model 200V

(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails should

be current limited to 10mA or less.

(3) Short-circuit to ground, one amplifier per package

(4) Continuous output current greater than 20 mA for extended periods may affect product reliability.

Product Folder Link(s): OPA365-EP