Datasheet

OPA330
OPA2330
OPA4330
www.ti.com
SBOS432E AUGUST 2008REVISED FEBRUARY 2011
PHOTOSENSITIVITY The QFN and DFN package can be easily mounted
using standard PCB assembly techniques. See
Although the OPA330 YFF package has a protective
Application Note QFN/SON PCB Attachment
backside coating that reduces the amount of light
(SLUA271) and Application Report Quad Flatpack
exposure on the die, unless fully shielded, ambient
No-Lead Logic Packages (SCBA017), both available
light can reach the active region of the device. Input
for download at www.ti.com.
bias current for the package is specified in the
absence of light. Depending on the amount of light The exposed leadframe die pad on the bottom of
exposure in a given application, an increase in bias the package should be connected to V.
current, and possible increases in offset voltage
should be expected. Fluorescent lighting may
QFN AND DFN LAYOUT GUIDELINES
introduce noise or hum because of the time-varying
The leadframe die pad should be soldered to a
light output. Best layout practices include end-product
thermal pad on the PCB. A mechanical data sheet
packaging that provides shielding from possible light
showing an example layout is attached at the end of
sources during operation.
this data sheet. Refinements to this layout may be
required based on assembly process requirements.
QFN AND DFN PACKAGES
Mechanical drawings located at the end of this data
The OPA4330 is offered in a QFN package. The sheet list the physical dimensions for the package
OPA2330 is available in a DFN-8 package (also and pad. The five holes in the landing pattern are
known as SON), which is a QFN package with lead optional, and are intended for use with thermal vias
contacts on only two sides of the bottom of the that connect the leadframe die pad to the heatsink
package. These leadless, near-chip-scale packages area on the PCB.
maximize board space and enhance thermal and
Soldering the exposed pad significantly improves
electrical characteristics through an exposed pad.
board-level reliability during temperature cycling, key
QFN and DFN packages are physically small, have a
push, package shear, and similar board-level tests.
smaller routing area, improved thermal performance,
Even with applications that have low-power
and improved electrical parasitics, with a pinout
dissipation, the exposed pad must be soldered to the
scheme that is consistent with other commonly-used
PCB to provide structural integrity and long-term
packages, such as SOIC and MSOP. Additionally, the
reliability.
absence of external leads eliminates bent-lead
issues.
© 20082011, Texas Instruments Incorporated Submit Documentation Feedback 13
Product Folder Link(s): OPA330 OPA2330 OPA4330