Datasheet

OPA27, OPA37
3
SBOS135C
www.ti.com
ELECTRICAL CHARACTERISTICS
At V
CC
= ±15V and T
A
= +25°C, unless otherwise noted.
OPA27
OPA37
PARAMETER CONDITIONS MIN TYP MAX UNITS
INPUT NOISE
(6)
Voltage, f
O
= 10Hz 3.8 8.0 nV/√Hz
f
O
= 30Hz 3.3 5.6 nV/√Hz
f
O
= 1kHz 3.2 4.5 nV/√Hz
f
B
= 0.1Hz to 10Hz 0.09 0.25 µV
PP
Current,
(1)
f
O
= 10Hz 1.7 pA/√Hz
f
O
= 30Hz 1.0 pA/√Hz
f
O
= 1kHz 0.4 0.6 pA/√Hz
OFFSET VOLTAGE
(2)
Input Offset Voltage ±25 ±100 µV
Average Drift
(3)
T
A MIN
to T
A MAX
±0.4 ±1.8
(6)
µV/°C
Long Term Stability
(4)
0.4 2.0 µV/mo
Supply Rejection ±V
CC
= 4 to 18V 94 120 dB
±V
CC
= 4 to 18V ±1 ±20 µV/V
BIAS CURRENT
Input Bias Current ±15 ±80 nA
OFFSET CURRENT
Input Offset Current 10 75 nA
IMPEDANCE
Common-Mode 2 || 2.5 GΩ || pF
VOLTAGE RANGE
Common-Mode Input Range ±11 ±12.3 V
Common-Mode Rejection V
IN
= ±11VDC 100 122 dB
OPEN-LOOP VOLTAGE GAIN, DC R
L
≥ 2kΩ 117 124 dB
R
L
≥ 1kΩ 124 dB
FREQUENCY RESPONSE
Gain-Bandwidth Product
(5)
OPA27 5
(6)
8 MHz
OPA37 45
(6)
63 MHz
Slew Rate
(5)
V
O
= ±10V,
R
L
= 2kΩ
OPA27, G = +1 1.7
(6)
1.9 V/µs
OPA37, G = +5 11
(6)
11.9 V/µs
Settling Time, 0.01% OPA27, G = +1 25 µs
OPA37, G = +5 25 µs
RATED OUTPUT
Voltage Output R
L
≥ 2kΩ±12 ±13.8 V
R
L
≥ 600Ω±10 ±12.8 V
Output Resistance DC, Open Loop 70 Ω
Short Circuit Current R
L
= 0Ω 25 60
(6)
mA
POWER SUPPLY
Rated Voltage ±15 VDC
Voltage Range,
Derated Performance ±4 ±22 VDC
Current, Quiescent I
O
= 0mADC 3.3 5.7 mA
TEMPERATURE RANGE
Specification –40 +85 °C
Operating –40 +85 °C
NOTES: (1) Measured with industry-standard noise test circuit (Figures 1 and 2). Due to errors introduced by this method, these current noise specifications should
be used for comparison purposes only. (2) Offset voltage specification are measured with automatic test equipment after approximately 0.5 seconds from power turn-
on. (3) Unnulled or nulled with 8kΩ to 20kΩ potentiometer. (4) Long-term voltage offset vs time trend line does not include warm-up drift. (5) Typical specification only
on plastic package units. Slew rate varies on all units due to differing test methods. Minimum specification applies to open-loop test. (6) This parameter specified by
design.