Datasheet

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ABSOLUTE MAXIMUM RATINGS
(1)
OPA333
OPA2333
SBOS351C – MARCH 2006 – REVISED MAY 2007
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
ORDERING INFORMATION
(1)
PRODUCT PACKAGE-LEAD PACKAGE DESIGNATOR PACKAGE MARKING
SOT23-5 DBV OAXQ
OPA333 SC70-5 DCK BQY
SO-8 D O333A
SO-8 D O2333A
OPA2333 DFN-8 DRB BQZ
MSOP-8 DGK OBAQ
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com .
OPA333, OPA2333 UNIT
Supply Voltage +7 V
Signal Input Terminals, Voltage
(2)
–0.3 to (V+) + 0.3 V
Signal Input Terminals, Voltage
(2)
± 10 mA
Output Short-Circuit
(3)
Continuous
Operating Temperature –40 to +150 ° C
Storage Temperature –65 to +150 ° C
Junction Temperature +150 ° C
ESD Ratings:
Human Body Model (HBM) 4000 V
Charged Device Model (CDM) 1000 V
Machine Model (MM) 400 V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not supported.
(2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.3V beyond the supply rails should
be current limited to 10mA or less.
(3) Short-circuit to ground, one amplifier per package.
2
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