Datasheet

OPA2180

OPA4180

SBOS584C –NOVEMBER 2011–REVISED DECEMBER 2012

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PACKAGE INFORMATION

(1)

PACKAGE SPECIFIED

PACKAGE-LEAD DESIGNATOR TEMPERATURE RANGE PACKAGE MARKING

DUAL

SO-8 D –40°C to +105°C 2180

OPA2180

MSOP-8 DGK –40°C to +105°C 2180

QUAD

SO-14 D –40°C to +105°C OPA4180

OPA4180

TSSOP-14 PW –40°C to +105°C OPA4180

(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the

device product folder at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

OPA2180, OPA4180 UNIT

Supply voltage ±20, 40 (single supply) V

Voltage (V–) – 0.5 to (V+) + 0.5 V

Signal input terminals

Current ±10 mA

Output short-circuit

(2)

Continuous

Operating temperature –55 to +125 °C

Storage temperature –65 to +150 °C

Junction temperature +150 °C

Human body model (HBM) 1.5 kV

ESD ratings

Charged device model (CDM) 1 kV

(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only and functional operation of the device at these or any other conditions beyond

those specified is not implied.

(2) Short-circuit to ground, one amplifier per package.

Product Folder Links: OPA2180 OPA4180