Datasheet

OPA141
OPA2141
OPA4141
SBOS510B –MARCH 2010–REVISED MAY 2010 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range (unless otherwise noted).
VALUE UNIT
Supply Voltage ±20 V
Voltage
(2)
(V–) –0.5 to (V+) +0.5 V
Signal Input
Terminals
Current
(2)
±10 mA
Output Short-Circuit
(3)
Continuous
Operating Temperature, T
A
–55 to +150 °C
Storage Temperature, T
A
–65 to +150 °C
Junction Temperature, T
J
+150 °C
Human Body Model (HBM) 2000 V
ESD Ratings
Charged Device Model (CDM) 500 V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not supported.
(2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails should
be current limited to 10 mA or less.
(3) Short-circuit to V
S
/2 (ground in symmetrical dual-supply setups), one amplifier per package.
PACKAGE INFORMATION
(1)
PRODUCT PACKAGE-LEAD PACKAGE DESIGNATOR PACKAGE MARKING
SO-8 D O141A
OPA141
MSOP-8 DGK 141
SO-8 D O2141A
OPA2141
MSOP-8 DGK 2141
TSSOP-14 PW O4141A
OPA4141
SO-14 D O4141AG4
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
2 Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): OPA141 OPA2141 OPA4141