Datasheet
NE556, SA556, SE556
DUAL PRECISION TIMERS
SLFS023E – APRIL 1978 – REVISED OCTOBER 2000
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
electrical characteristics, V
CC
= 5 V to 15 V, T
A
= 25°C (unless otherwise noted) (continued)
PARAMETER TEST CONDITIONS
NE556
SA556
SE556
UNIT
MIN TYP MAX MIN TYP MAX
V
CC
= 15 V,
0.1 0.25 0.1 0.15
CC
,
I
OL
= 10 mA
T
A
= –55°C to 125°C 0.2
V
CC
= 15 V,
0.4 0.75 0.4 0.5
CC
,
I
OL
= 50 mA
T
A
= –55°C to 125°C 1
V
CC
= 15 V,
2 2.5 2 2.2
V
OL
Low-level
CC
,
I
OL
= 100 mA
T
A
= –55°C to 125°C 2.7
V
V
OL
output voltage
V
CC
= 15 V,
I
OL
= 200 mA 2.5 2.5
V
V
CC
= 5 V,
I
OL
= 3.5 mA
T
A
= –55°C to 125°C 0.35
V
CC
= 5 V,
0.1 0.25 0.1 0.15
CC
,
I
OL
= 5 mA
T
A
= –55°C to 125°C 0.8
V
CC
= 5 V, I
OL
= 8 mA 0.15 0.3 0.15 0.25
V
CC
= 15 V,
12.75 13.3 13 13.3
Hi h l l
CC
,
I
OH
= –100 mA
T
A
= –55°C to 125°C 12
V
OH
High-level
out
p
ut voltage
V
CC
= 15 V, I
OH
= –200 mA 12.5 12.5
V
out ut
voltage
V
CC
= 5 V,
2.75 3.3 3 3.3
CC
,
I
OH
= –100 mA
T
A
= –55°C to 125°C 2
Output low,
V
CC
= 15 V 20 30 20 24
I
CC
Su
pp
ly current
,
No load
V
CC
= 5 V 6 12 6 10
mA
I
CC
S
u
ppl
y
c
u
rrent
Output high,
V
CC
= 15 V 18 26 18 20
mA
g
No load
V
CC
= 5 V 4 10 4 8
operating characteristics, V
CC
= 5 V and 15 V
PARAMETER TEST CONDITIONS
†
NE556
SA556
SE556
UNIT
MIN TYP MAX MIN TYP MAX
I iti l
Each timer, monostable
§
1 3 0.5 1.5*
Initial error
of timing interval
‡
Each timer, astable
¶
T
A
= 25°C
2.25% 1.5%
of
timing
interval
‡
Timer 1–Timer 2 ±1 ±0.5
Tem
p
erature
Each timer, monostable
§
50 30 100*
Tem erature
coefficient
Each timer, astable
¶
T
A
= MIN to MAX
150 90
ppm/°C
of timing interval
Timer 1–Timer 2 ±10 ±10
Suppl
y
volta
g
e
Each timer, monostable
§
0.1 0.5 0.05 0.2*
Su ly
voltage
sensitivity
fi i i l
Each timer, astable
¶
T
A
= 25°C
0.3 0.15
%/V
of timing interval
Timer 1–Timer 2 ±0.2 ±0.1
Output pulse rise time C
L
= 15 pF, T
A
= 25°C 100 300 100 200* ns
Output pulse fall time C
L
= 15 pF, T
A
= 25°C 100 300 100 200* ns
* On products compliant to MIL-PRF-38535, this parameter is not production tested.
†
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
‡
Timing-interval error is defined as the difference between the measured value and the average value of a random sample from each process
run.
§
Values specified are for a device in a monostable circuit similar to Figure 2, with the following component values: R
A
= 2 kΩ to 100 kΩ, C = 0.1 µF.
¶
Values specified are for a device in an astable circuit similar to Figure 1, with the following component values: R
A
= 1 kΩ to 100 kΩ, C = 0.1 µF.