Datasheet

SDA
SCL
t
HD,DAT
t
SU,DAT
t
HD,STA
t
HIGH
t
LOW
t
BUF
t
HD,STA
t
SU,STA
t
SP
t
SU,STO
MSP430G2x53
MSP430G2x13
www.ti.com SLAS735J –APRIL 2011–REVISED MAY 2013
USCI (I2C Mode)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 20)
PARAMETER TEST CONDITIONS V
CC
MIN TYP MAX UNIT
f
USCI
USCI input clock frequency SMCLK, duty cycle = 50% ± 10% f
SYSTEM
MHz
f
SCL
SCL clock frequency 3 V 0 400 kHz
f
SCL
≤ 100 kHz 4.0
t
HD,STA
Hold time (repeated) START 3 V µs
f
SCL
> 100 kHz 0.6
f
SCL
≤ 100 kHz 4.7
t
SU,STA
Setup time for a repeated START 3 V µs
f
SCL
> 100 kHz 0.6
t
HD,DAT
Data hold time 3 V 0 ns
t
SU,DAT
Data setup time 3 V 250 ns
t
SU,STO
Setup time for STOP 3 V 4.0 µs
Pulse width of spikes suppressed by
t
SP
3 V 50 100 600 ns
input filter
Figure 20. I2C Mode Timing
Comparator_A+
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER TEST CONDITIONS V
CC
MIN TYP MAX UNIT
I
(DD)
(1)
CAON = 1, CARSEL = 0, CAREF = 0 3 V 45 µA
CAON = 1, CARSEL = 0,
I
(Refladder/
CAREF = 1, 2, or 3, 3 V 45 µA
RefDiode)
No load at CA0 and CA1
V
(IC)
Common–mode input voltage CAON = 1 3 V 0 V
CC
-1 V
PCA0 = 1, CARSEL = 1, CAREF = 1,
V
(Ref025)
(Voltage at 0.25 V
CC
node) / V
CC
3 V 0.24
No load at CA0 and CA1
PCA0 = 1, CARSEL = 1, CAREF = 2,
V
(Ref050)
(Voltage at 0.5 V
CC
node) / V
CC
3 V 0.48
No load at CA0 and CA1
PCA0 = 1, CARSEL = 1, CAREF = 3,
V
(RefVT)
See Figure 21 and Figure 22 3 V 490 mV
No load at CA0 and CA1, TA = 85°C
V
(offset)
Offset voltage
(2)
3 V ±10 mV
V
hys
Input hysteresis CAON = 1 3 V 0.7 mV
T
A
= 25°C, Overdrive 10 mV,
120 ns
Without filter: CAF = 0
Response time
t
(response)
3 V
(low-high and high-low)
T
A
= 25°C, Overdrive 10 mV,
1.5 µs
With filter: CAF = 1
(1) The leakage current for the Comparator_A+ terminals is identical to I
lkg(Px.y)
specification.
(2) The input offset voltage can be cancelled by using the CAEX bit to invert the Comparator_A+ inputs on successive measurements. The
two successive measurements are then summed together.
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