Datasheet

MSP430FW42x

SLAS383D –OCTOBER 2003–REVISED JANUARY 2011

www.ti.com

Table 2. Terminal Functions (continued)

TERMINAL

I/O DESCRIPTION

NAME NO.

COM0 36 O Common output. COM0-3 are used for LCD backplanes

P5.2/COM1 37 I/O General-purpose digital I/O/common output. COM0-3 are used for LCD backplanes

P5.3/COM2 38 I/O General-purpose digital I/O/common output. COM0-3 are used for LCD backplanes

P5.4/COM3 39 I/O General-purpose digital I/O/common output. COM0-3 are used for LCD backplanes

R03 40 I Input port of fourth positive (lowest) analog LCD level (V5)

P5.5/R13 41 I/O General-purpose digital I/O/input port of third most positive analog LCD level (V4 or V3)

P5.6/R23 42 I/O General-purpose digital I/O/input port of second most positive analog LCD level (V2)

P5.7/R33 43 I/O General-purpose digital I/O/output port of most positive analog LCD level (V1)

P6.0/SIFCH0 59 I/O General-purpose digital I/O/Scan IF, channel 0 sensor excitation output and signal input

P6.1/SIFCH1 60 I/O General-purpose digital I/O/Scan IF, channel 1 sensor excitation output and signal input

P6.2/SIFCH2 61 I/O General-purpose digital I/O/Scan IF, channel 2 sensor excitation output and signal input

P6.3/SIFCH3/ 2 I/O General-purpose digital I/O/Scan IF, channel 3 sensor excitation output and signal input/Scan

SIFCAOUT IF comparator output

P6.4/SIFCI0 3 I/O General-purpose digital I/O/Scan IF, channel 0 signal input to comparator

P6.5/SIFCI1 4 I/O General-purpose digital I/O/Scan IF, channel 1 signal input to comparator

P6.6/SIFCI2/ 5 I/O General-purpose digital I/O/Scan IF, channel 2 signal input to comparator/10-bit DAC output

SIFDACOUT

P6.7/SIFCI3/SVSIN 6 I/O General-purpose digital I/O/Scan IF, channel 3 signal input to comparator/SVS, analog input

SIFCI 7 I Scan IF input to Comparator.

SIFCOM 11 O Common termination for Scan IF sensors.

RST/NMI 58 I Reset input or nonmaskable interrupt input port.

TCK 57 I Test clock. TCK is the clock input port for device programming and test.

TDI/TCLK 55 I Test data input or test clock input. The device protection fuse is connected to TDI/TCLK.

TDO/TDI 54 I/O Test data output port. TDO/TDI data output or programming data input terminal.

TMS 56 I Test mode select. TMS is used as an input port for device programming and test.

XIN 8 I Input port for crystal oscillator XT1. Standard or watch crystals can be connected.

XOUT 9 O Output terminal of crystal oscillator XT1.