Datasheet

MSP430FR573x
MSP430FR572x
SLAS639H JULY 2011REVISED SEPTEMBER 2013
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Crystal Oscillator, XT1, High-Frequency (HF) Mode
(1)
(continued)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER TEST CONDITIONS V
CC
MIN TYP MAX UNIT
Integrated effective load
C
L,eff
XTS = 1 1 pF
capacitance
(7) (8)
XTS = 1, Measured at ACLK,
Duty cycle, HF mode 40 50 60 %
f
XT1,HF2
= 24 MHz
Oscillator fault frequency, HF mode
f
Fault,HF
XTS = 1
(10)
145 900 kHz
(9)
(7) Includes parasitic bond and package capacitance (approximately 2 pF per pin). Because the PCB adds additional capacitance, it is
recommended to verify the correct load by measuring the ACLK frequency. For a correct setup, the effective load capacitance should
always match the specification of the used crystal.
(8) Requires external capacitors at both terminals. Values are specified by crystal manufacturers. Recommended values supported are 14
pF, 16 pF, and 18 pF. Maximum shunt capacitance of 7 pF.
(9) Frequencies below the MIN specification set the fault flag. Frequencies above the MAX specification do not set the fault flag.
Frequencies in between might set the flag.
(10) Measured with logic-level input frequency but also applies to operation with crystals.
Internal Very-Low-Power Low-Frequency Oscillator (VLO)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER TEST CONDITIONS V
CC
MIN TYP MAX UNIT
f
VLO
VLO frequency Measured at ACLK 2 V to 3.6 V 5 8.3 13 kHz
df
VLO
/d
T
VLO frequency temperature drift Measured at ACLK
(1)
2 V to 3.6 V 0.5 %/°C
df
VLO
/dV
CC
VLO frequency supply voltage drift Measured at ACLK
(2)
2 V to 3.6 V 4 %/V
f
VLO,DC
Duty cycle Measured at ACLK 2 V to 3.6 V 40 50 60 %
(1) Calculated using the box method: (MAX(-40 to 85°C) MIN(-40 to 85°C)) / MIN(-40 to 85°C) / (85°C (–40°C))
(2) Calculated using the box method: (MAX(2.0 to 3.6 V) MIN(2.0 to 3.6 V)) / MIN(2.0 to 3.6 V) / (3.6 V 2 V)
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