Datasheet

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SLAS439A − SEPTEMBER 2004 − REVISED JUNE 2005
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME
DW, PW, or DGV RGE
I/O
DESCRIPTION
NAME
NO. NO.
I/O
DESCRIPTION
P1.0/TACLK 13 13 I/O General-purpose digital I/O pin
Timer_A, clock signal TACLK input
P1.1/TA0 14 14 I/O General-purpose digital I/O pin
Timer_A, capture: CCI0A input, compare: Out0 output/BSL transmit
P1.2/TA1 15 15 I/O General-purpose digital I/O pin
Timer_A, capture: CCI1A input, compare: Out1 output
P1.3/TA2 16 16 I/O General-purpose digital I/O pin
Timer_A, capture: CCI2A input, compare: Out2 output
P1.4/SMCLK/TCK 17 17 I/O General-purpose digital I/O pin / SMCLK signal output
Test Clock input for device programming and test
P1.5/TA0/TMS 18 18 I/O General-purpose digital I/O pin / Timer_A, compare: Out0 output
Test Mode Select input for device programming and test
P1.6/TA1/TDI/TCLK 19 20 I/O General-purpose digital I/O pin / Timer_A, compare: Out1 output
Test Data Input or Test Clock Input for programming and test
P1.7/TA2/TDO/TDI
20 21 I/O General-purpose digital I/O pin / Timer_A, compare: Out2 output
Test Data Output or Test Data Input for programming and test
P2.0/ACLK/CA2 8 6 I/O General-purpose digital I/O pin / ACLK output
Comparator_A+, CA2 input
P2.1/INCLK/CA3 9 7 I/O General-purpose digital I/O pin / Timer_A, clock signal at INCLK
Comparator_A+, CA3 input
P2.2/CAOUT/
TA0/CA4
10 8 I/O General-purpose digital I/O pin
Timer_A, capture: CCI0B input/BSL receive
Comparator_A+, output / CA4 input
P2.3/CA0/TA1 11 10 I/O General-purpose digital I/O pin / Timer_A, compare: Out1 output
Comparator_A+, CA0 input
P2.4/CA1/TA2 12 11 I/O General-purpose digital I/O pin / Timer_A, compare: Out2 output
Comparator_A+, CA1 input
P2.5/CA5 3 24 I/O General-purpose digital I/O pin
Comparator_A+, CA5 input
XIN/P2.6/CA6 6 4 I/O Input terminal of crystal oscillator
General-purpose digital I/O pin
Comparator_A+, CA6 input
XOUT/P2.7/CA7 5 3 I/O Output terminal of crystal oscillator
general-purpose digital I/O pin
Comparator_A+, CA7 input
RST/NMI 7 5 I Reset or nonmaskable interrupt input
TEST 1 22 I Selects test mode for JTAG pins on Port1. The device protection fuse
is connected to TEST.
V
CC
2 23 Supply voltage
V
SS
4 2 Ground reference
QFN Pad NA Package Pad NA QFN package pad connection to V
SS
recommended.
TDO or TDI is selected via JTAG instruction.
NOTE: If XOUT/P2.7/CA7 is used as an input, excess current will flow until P2SEL.7 is cleared. This is due to the oscillator output driver
connection to this pad after reset.