Datasheet
MSP430F21x1
www.ti.com
SLAS439F –SEPTEMBER 2004– REVISED AUGUST 2011
Table 2. Terminal Functions
TERMINAL
NO.
DW,
I/O DESCRIPTION
NAME
PW,
RGE
or
DGV
General-purpose digital I/O pin
P1.0/TACLK 13 13 I/O
Timer_A, clock signal TACLK input
General-purpose digital I/O pin
P1.1/TA 14 14 I/O
Timer_A, capture: CCI0A input, compare: Out0 output/BSL transmit
General-purpose digital I/O pin
P1.2/TA1 15 15 I/O
Timer_A, capture: CCI1A input, compare: Out1 output
General-purpose digital I/O pin
P1.3/TA2 16 16 I/O
Timer_A, capture: CCI2A input, compare: Out2 output
General-purpose digital I/O pin / SMCLK signal output
P1.4/SMCLK/TCK 17 17 I/O
Test Clock input for device programming and test
General-purpose digital I/O pin / Timer_A, compare: Out0 output
P1.5/TA/TMS 18 18 I/O
Test Mode Select input for device programming and test
General-purpose digital I/O pin / Timer_A, compare: Out1 output
P1.6/TA1/TDI/TCLK 19 20 I/O
Test Data Input or Test Clock Input for programming and test
General-purpose digital I/O pin / Timer_A, compare: Out2 output
P1.7/TA2/TDO/TDI
(1)
20 21 I/O
Test Data Output or Test Data Input for programming and test
General-purpose digital I/O pin / ACLK output
P2.0/ACLK/CA2 8 6 I/O
Comparator_A+, CA2 input
General-purpose digital I/O pin / Timer_A, clock signal at INCLK
P2.1/INCLK/CA3 9 7 I/O
Comparator_A+, CA3 input
General-purpose digital I/O pin
P2.2/CAOUT/TA/CA4 10 8 I/O Timer_A, capture: CCI0B input/BSL receive
Comparator_A+, output / CA4 input
General-purpose digital I/O pin / Timer_A, compare: Out1 output
P2.3/CA0/TA1 11 10 I/O
Comparator_A+, CA0 input
General-purpose digital I/O pin / Timer_A, compare: Out2 output
P2.4/CA1/TA2 12 11 I/O
Comparator_A+, CA1 input
General-purpose digital I/O pin
P2.5/CA5 3 24 I/O
Comparator_A+, CA5 input
Input terminal of crystal oscillator
XIN/P2.6/CA6 6 4 I/O General-purpose digital I/O pin
Comparator_A+, CA6 input
Output terminal of crystal oscillator
XOUT/P2.7/CA7
(2)
5 3 I/O General-purpose digital I/O pin
Comparator_A+, CA7 input
RST/NMI 7 5 I Reset or nonmaskable interrupt input
Selects test mode for JTAG pins on Port1. The device protection fuse is connected to
TEST 1 22 I
TEST.
V
CC
2 23 Supply voltage
V
SS
4 2 Ground reference
QFN Pad NA Pad NA QFN package thermal pad. Connect to V
SS
.
(1) TDO or TDI is selected via JTAG instruction.
(2) If XOUT/P2.7/CA7 is used as an input, excess current will flow until P2SEL.7 is cleared. This is due to the oscillator output driver
connection to this pad after reset.
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