Datasheet

MSP430F2013-EP
SLAS774A –JULY 2011– REVISED OCTOBER 2011 www.ti.com
Table 2. Terminal Functions
TERMINAL
DESCRIPTION
NAME NO. I/O
General-purpose digital I/O pin
Timer_A, clock signal TACLK input
P1.0/TACLK/ACLK/A0+ 1 I/O
ACLK signal output
SD16_A positive analog input A0
General-purpose digital I/O pin
Timer_A, capture: CCI0A input, compare: Out0 output
P1.1/TA0/A0-/A4+ 2 I/O
SD16_A negative analog input A0
SD16_A positive analog input A4
General-purpose digital I/O pin
Timer_A, capture: CCI1A input, compare: Out1 output
P1.2/TA1/A1+/A4- 3 I/O
SD16_A positive analog input A1
SD16_A negative analog input A4
General-purpose digital I/O pin
Input for an external reference voltage/internal reference voltage output (can be used as
P1.3/VREF/A1- 4 I/O
mid-voltage)
SD16_A negative analog input A1
General-purpose digital I/O pin
SMCLK signal output
P1.4/SMCLK/A2+/TCK 5 I/O
SD16_A positive analog input A2
JTAG test clock, input terminal for device programming and test
General-purpose digital I/O pin
Timer_A, compare: Out0 output
P1.5/TA0/A2-/SCLK/TMS 6 I/O SD16_A negative analog input A2
USI: external clock input in SPI or I2C mode; clock output in SPI mode
JTAG test mode select, input terminal for device programming and test
General-purpose digital I/O pin
Timer_A, capture: CCI1B input, compare: Out1 output
P1.6/TA1/A3+/SDO/SCL/
7 I/O SD16_A positive analog input A3
TDI/TCLK
USI: Data output in SPI mode; I2C clock in I2C mode
JTAG test data input or test clock input during programming and test
General-purpose digital I/O pin
P1.7/A3-/SDI/SDA/ SD16_A negative analog input A3
8 I/O
TDO/TDI
(1)
USI: Data input in SPI mode; I2C data in I2C mode
JTAG test data output terminal or test data input during programming and test
Input terminal of crystal oscillator
XIN/P2.6/TA1 12 I/O General-purpose digital I/O pin
Timer_A, compare: Out1 output
Output terminal of crystal oscillator
XOUT/P2.7 11 I/O
General-purpose digital I/O pin
(2)
Reset or nonmaskable interrupt input
RST/NMI/SBWTDIO 9 I
Spy-Bi-Wire test data input/output during programming and test
Selects test mode for JTAG pins on Port 1. The device protection fuse is connected to
TEST/SBWTCK 10 I TEST.
Spy-Bi-Wire test clock input during programming and test
DV
CC
16 Digital supply voltage
AV
CC
15 Analog supply voltage
DV
SS
14 Digital ground reference
AV
SS
13 Analog ground reference
QFN Pad Pad NA QFN package pad. Connection to VSS is recommended.
(1) TDO or TDI is selected via JTAG instruction.
(2) If XOUT/P2.7 is used as an input, excess current flows until P2SEL.7 is cleared. This is due to the oscillator output driver connection to
this pad after reset.
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