Datasheet

ECCN 5E002 TSPA - Technology / Software Publicly Available
CC430F6137, CC430F6135, CC430F6127, CC430F6126, CC430F6125
CC430F5137, CC430F5135, CC430F5133
SLAS554H –MAY 2009–REVISED SEPTEMBER 2013 www.ti.com
Frequency Synthesizer Characteristics
T
A
= 25°C, V
CC
= 3 V (unless otherwise noted)
(1)
MIN figures are given using a 27MHz crystal. TYP and MAX figures are given using a 26MHz crystal.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Programmed frequency resolution
(2)
26- to 27-MHz crystal 397 f
XOSC
/2
16
412 Hz
Synthesizer frequency tolerance
(3)
±40 ppm
50-kHz offset from carrier –95
100-kHz offset from carrier –94
200-kHz offset from carrier –94
500-kHz offset from carrier –98
RF carrier phase noise dBc/Hz
1-MHz offset from carrier –107
2-MHz offset from carrier –112
5-MHz offset from carrier –118
10-MHz offset from carrier –129
PLL turn-on and hop time
(4)
Crystal oscillator running 85.1 88.4 88.4 µs
PLL RX to TX settling time
(5)
9.3 9.6 9.6 µs
PLL TX to RX settling time
(6)
20.7 21.5 21.5 µs
PLL calibration time
(7)
694 721 721 µs
(1) All measurement results are obtained using the EM430F6137RF900 with BOM according to tested frequency range (see Table 48).
(2) The resolution (in Hz) is equal for all frequency bands.
(3) Depends on crystal used. Required accuracy (including temperature and aging) depends on frequency band and channel bandwidth and
spacing.
(4) Time from leaving the IDLE state until arriving in the RX, FSTXON, or TX state, when not performing calibration.
(5) Settling time for the 1-IF frequency step from RX to TX
(6) Settling time for the 1-IF frequency step from TX to RX
(7) Calibration can be initiated manually or automatically before entering or after leaving RX or TX.
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CC430F5135 CC430F5133