Datasheet

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 ±  
SLLS590D − SEPTEMBER 2003 − REVISED AUGUST 2004
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
DRIVER SECTION
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Note 4 and Figure 4)
PARAMETER TEST CONDITIONS MIN TYP
†
MAX UNIT
V
OH
High-level output voltage DOUT at R
L
= 3 kΩ to GND, D
IN
= GND 5 8 V
V
OL
Low-level output voltage DOUT at R
L
= 3 kΩ to GND, D
IN
= V
CC
−5 −8 V
I
IH
Driver high-level input current DIN = V
CC
5 40
A
I
IH
Control high-level input current SHDN = V
CC
0.01 1
µA
I
IL
Driver low-level input current DIN = 0 V −5 −40
A
I
IL
Control low-level input current SHDN = 0 V −0.01 −1
µA
I
OS
‡
Short-circuit output current V
CC
= 5.5 V, V
O
= 0 V ±7 ±22 mA
I
off
Output leakage current V
CC
= 5.5 V, SHDN = GND, V
O
= ±10 V ±0.01 ±10 µA
r
o
Output resistance V
CC
, V+, and V− = 0 V, V
O
= ±2 V 300 10 M W
†
All typical values are at V
CC
= 5 V, and T
A
= 25°C.
‡
Short-circuit durations should be controlled to prevent exceeding the device absolute power-dissipation ratings, and not more than one output
should be shorted at a time.
NOTE 4: Test conditions are C1−C4 = 0.1 µF at V
CC
= 5 V ± 0.5 V.
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Note 4 and Figure 4)
PARAMETER TEST CONDITIONS MIN TYP
†
MAX UNIT
Data rate
C
L
= 1000 pF,
One D
OUT
switching,
R
L
= 3 kΩ,
See Figure 1
200 kbit/s
t
PLH (D)
Propagation delay time,
low- to high-level output
See Figure 1 1.5 3.5 µs
t
PHL (D)
Propagation delay time,
high- to low-level output
See Figure 1 1.3 3.5 µs
t
PHL (D)
−
t
PLH (D)
Driver (+ to −) propagation delay
difference
300 ns
t
sk(p)
Pulse skew
§
C
L
= 150 pF to 2500 pF
R
L
= 3 kΩ to 7 kΩ,
See Figure 2
300 ns
SR(tr)
Slew rate, transition region
(see Figure 1)
R
L
= 3 kΩ to 7 kΩ,
V
CC
= 5 V
C
L
= 50 pF to 2500 pF 6 12 30 V/µs
t
ET
Driver output enable time
(after SHDN
goes high)
250 µs
t
DT
Driver output disable time
(after SHDN
goes low)
300 ns
†
All typical values are at V
CC
= 5 V and T
A
= 25°C.
§
Pulse skew is defined as |t
PLH
− t
PHL
| of each channel of the same device.
NOTE 4: Test conditions are C1−C4 = 0.1 µF at V
CC
= 5 V ± 0.5 V.