Datasheet

LPV7215
SNOSAI6I SEPTEMBER 2005REVISED APRIL 2013
www.ti.com
2.7V ELECTRICAL CHARACTERISTICS
(1)
Unless otherwise specified, all limits are specified for T
A
= 25°C, V
+
= 2.7V, V
= 0V, and V
CM
= V
+
/2, V
O
= V
. Boldface limits
apply at the temperature extremes.
Symbol Parameter Conditions Min
(2)
Typ
(3)
Max
(2)
Units
I
S
Supply Current V
CM
= 0.3V 605 780
1100
nA
V
CM
= 2.4V 815 1010
1350
V
OS
Input Offset Voltage V
CM
= 0V ±0.3 ±6
±8
mV
V
CM
= 2.7V ±0.3 ±5
±7
TCV
OS
Input Offset Average Drift See
(4)
±1 μV/C
I
B
Input Bias Current
(5)
V
CM
= 1.8V 40 fA
I
OS
Input Offset Current 20 fA
CMRR Common Mode Rejection Ratio V
CM
Stepped from 0V to 1.6V 72 90
66
V
CM
Stepped from 2.1V to 2.7V 71 94
dB
63
V
CM
Stepped from 0V to 2.7V 47 80
46
PSRR Power Supply Rejection Ratio V
+
= 1.8V to 5.5V, V
CM
= 0V 66 82
dB
63
CMVR Input Common-Mode Voltage Range CMRR 40 dB 0.1 2.8 V
A
V
Voltage Gain 120 dB
V
O
Output Swing High I
O
= 500 μA 2.57 2.62
2.53
V
I
O
= 1 mA 2.47 2.53
2.40
Output Swing Low I
O
= 500 μA 60 130
190
mV
I
O
= 1 mA 120 250
330
I
OUT
Output Current Source 4.5 5.7
V
O
= V
+
/2 3.4
mA
Sink 5.6 7.5
V
O
= V
+
/2 3.2
Propagation Delay Overdrive = 10 mV 14.5
(High to Low)
Overdrive = 100 mV 5.8 8.5
10.5
μs
Propagation Delay Overdrive = 10 mV 15
(Low to High)
Overdrive = 100 mV 7.5 10
12.5
t
rise
Rise Time Overdrive = 10 mV
90
C
L
= 30 pF, R
L
= 1 M
ns
Overdrive = 100 mV
85
C
L
= 30 pF, R
L
= 1 M
(1) Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using
statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(4) Offset voltage average drift determined by dividing the change in V
OS
at temperature extremes into the total temperature change.
(5) Positive current corresponds to current flowing into the device.
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