Datasheet
LPV531
SNOSAK5B –MARCH 2006–REVISED MARCH 2013
www.ti.com
5V Mid-Power Mode Electrical Characteristics
Unless otherwise specified, all limits are ensured for T
J
= 25°C, V
+
= 5V, V
−
= 0V, V
CM
= V
O
= V
+
/2, I
SEL
pin connected to V
−
through 100 kΩ resistor, R
L
= 100 kΩ. Boldface limits apply at the temperature extremes.
Symbol Parameter Conditions Min
(1)
Typ
(2)
Max
(1)
Units
V
OS
Input Offset Voltage ±1 ±4.5
mV
±5
ΔV
OS
Input Offset Voltage Difference (V
OS
in Full Power Mode) − ±0.1 ±2
mV
(V
OS
in Low Power Mode)
TC V
OS
Input Offset Average Drift
(3)
±2 μV/°C
I
B
Input Bias Current
(4)
.05 ±10 pA
±100
CMRR Common Mode Rejection Ratio V
CM
Stepped from 0V to 3.5V 72 92
dB
68
PSRR Power Supply Rejection Ratio V
+
= 2.7V to 5.5V 72 88
dB
68
CMVR Input Common Mode Voltage CMRR ≥ 50 dB −0.3 3.8
V
Range
A
VOL
Large Signal Voltage Gain V
O
= 0.5V to 4.5V 86 96
R
L
= 10 kΩ to V
+
/2 82
dB
V
O
= 0.5V to 4.5V 100 114
R
L
= 100 kΩ to V
+
/2 98
V
O
Output Swing High R
L
= 10 kΩ to V
+
/2 115 160
175
mV from
V
+
R
L
= 100 kΩ to V
+
/2 65 110
120
Output Swing Low R
L
= 10 kΩ to V
+
/2 150 165
180
mV
R
L
= 100 kΩ to V
+
/2 105 120
135
I
SC
Output Short Circuit Current Sourcing, V
O
= 2.5V −4 −1.5
(5)
V
ID
= 100 mV −1
mA
Sinking, V
O
= 2.5V 1.5 4
V
ID
= −100 mV 1
I
S
Supply Current 42 55
μA
62
SR Slew Rate
(6)
A
V
= +1, V
IN
= 0.5V to 3.5V 180 250
V/ms
100
GBW Gain Bandwidth Product C
L
= 20 pF 625 kHz
e
n
Input-Referred Voltage Noise f = 100 kHz 55
nV/√Hz
f = 1 kHz 60
i
n
Input-Referred Current Noise f = 1 kHz 6 fA/√Hz
(1) All limits are specified by testing or statistical analysis.
(2) Typical values represent the most likely parametric norm.
(3) Offset voltage average drift is determined by dividing the change in V
OS
at temperature extremes into the total temperature change.
(4) Specified by design.
(5) Continuous short circuit operation at elevated ambient temperature can result in exceeding the maximum allowed junction temperature
of 150°C.
(6) Slew rate is the slower of the rising or falling slew rates.
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