Datasheet

LPV521
SNOSB14C –AUGUST 2009–REVISED FEBRUARY 2013 www.ti.com
5V DC Electrical Characteristics
(1)
(continued)
Unless otherwise specified, all limits guaranteed for T
A
= 25°C, V
+
= 5V, V
−
= 0V, V
CM
= V
O
= V
+
/2, and R
L
> 1MΩ. Boldface
limits apply at the temperature extremes.
Symbol Parameter Conditions Min Typ Max Units
(2) (3) (2)
TCV
OS
Input Offset Voltage Drift
(4)
±0.4 ±3.5 μV/°C
I
BIAS
Input Bias Current 0.04 ±1
pA
±50
I
OS
Input Offset Current 60 fA
CMRR Common Mode Rejection Ratio 0V ≤ V
CM
≤ 5.0V 75 102
74
0V ≤ V
CM
≤ 3.9V 84 108
dB
80
4.4V ≤ V
CM
≤ 5.0V 77 115
76
PSRR Power Supply Rejection Ratio 1.6V ≤ V
+
≤ 5.5V 85 109
dB
V
CM
= 0.3V 76
CMVR Common Mode Voltage Range CMRR ≥ 75 dB −0.1 5.1
V
CMRR ≥ 74 dB 0 5
A
VOL
Large Signal Voltage Gain V
O
= 0.5V to 4.5V 84 132 dB
R
L
= 100 kΩ to V
+
/2 76
V
O
Output Swing High R
L
= 100 kΩ to V
+
/2 3 50
V
IN
(diff) = 100 mV 50
mV from
either rail
Output Swing Low R
L
= 100 kΩ to V
+
/2 3 50
V
IN
(diff) = −100 mV 50
I
O
Output Current
(5)
Sourcing, V
O
to V
−
15 23
V
IN
(diff) = 100 mV 8
mA
Sinking, V
O
to V
+
15 22
V
IN
(diff) = −100 mV 8
I
S
Supply Current V
CM
= 0.3V 351 400
620
nA
V
CM
= 4.7V 475 600
870
(4) The offset voltage average drift is determined by dividing the change in V
OS
at the temperature extremes by the total temperature
change.
(5) The short circuit test is a momentary open loop test.
5V AC Electrical Characteristics
(1)
Unless otherwise specified, all limits guaranteed for T
A
= 25°C, V
+
= 5V, V
−
= 0V, V
CM
= V
O
= V
+
/2, and R
L
> 1MΩ. Boldface
limits apply at the temperature extremes.
Symbol Parameter Conditions Min Typ Max Units
(2) (3) (2)
GBW Gain-Bandwidth Product C
L
= 20 pF, R
L
= 100 kΩ 6.2 kHz
SR Slew Rate A
V
= +1, Falling Edge 1.1 2.7
V
IN
= 0V to 5V 1.2
V/ms
Rising Edge 1.1 2.4
1.2
θ
m
Phase Margin C
L
= 20 pF, R
L
= 100 kΩ 73 deg
G
m
Gain Margin C
L
= 20 pF, R
L
= 100 kΩ 20 dB
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No guarantee of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T
J
> T
A
. Absolute Maximum Ratings indicate junction temperature limits beyond which the
device may be permanently degraded, either mechanically or electrically.
(2) All limits are guaranteed by testing, statistical analysis or design.
(3) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and
will also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production
material.
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