Datasheet
LPV521
www.ti.com
SNOSB14C –AUGUST 2009–REVISED FEBRUARY 2013
1.8V DC Electrical Characteristics
(1)
Unless otherwise specified, all limits guaranteed for T
A
= 25°C, V
+
= 1.8V, V
−
= 0V, V
CM
= V
O
= V
+
/2, and R
L
> 1 MΩ.
Boldface limits apply at the temperature extremes.
Min Typ Max
Symbol Parameter Conditions Units
(2) (3) (2)
V
OS
Input Offset Voltage V
CM
= 0.3V 0.1 ±1.0
±1.23
mV
0.1 ±1.0
V
CM
= 1.5V
±1.23
TCV
OS
Input Offset Voltage Drift
(4)
±0.4 ±3 μV/°C
I
BIAS
Input Bias Current 0.01 ±1
pA
±50
I
OS
Input Offset Current 10 fA
CMRR Common Mode Rejection Ratio 0V ≤ V
CM
≤ 1.8V 66 92
60
75 101
0V ≤ V
CM
≤ 0.7V dB
74
75 120
1.2V ≤ V
CM
≤ 1.8V
53
PSRR Power Supply Rejection Ratio 1.6V ≤ V
+
≤ 5.5V 85 109 dB
V
CM
= 0.3V 76
CMRR ≥ 67 dB 0 1.8 V
CMVR Common Mode Voltage Range
CMRR ≥ 60 dB 0 1.8
V
O
= 0.5V to 1.3V 74 125 dB
A
VOL
Large Signal Voltage Gain
R
L
= 100 kΩ to V
+
/2 73
V
O
Output Swing High R
L
= 100 kΩ to V
+
/2 2 50
V
IN
(diff) = 100 mV 50
mV from
either rail
Output Swing Low R
L
= 100 kΩ to V
+
/2 2 50
V
IN
(diff) = −100 mV 50
I
O
Sourcing, V
O
to V
–
1 3
V
IN
(diff) = 100 mV 0.5
Output Current
(5)
mA
Sinking, V
O
to V
+
1 3
V
IN
(diff) = −100 mV 0.5
I
S
Supply Current V
CM
= 0.3V 345 400
580
nA
472 600
V
CM
= 1.5V
850
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No guarantee of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T
J
> T
A
. Absolute Maximum Ratings indicate junction temperature limits beyond which the
device may be permanently degraded, either mechanically or electrically.
(2) All limits are guaranteed by testing, statistical analysis or design.
(3) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and
will also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production
material.
(4) The offset voltage average drift is determined by dividing the change in V
OS
at the temperature extremes by the total temperature
change.
(5) The short circuit test is a momentary open loop test.
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