Datasheet
LP2996-N
www.ti.com
SNOSA40J –NOVEMBER 2002–REVISED MARCH 2013
Operating Range
Junction Temp. Range
(1)
0°C to +125°C
AVIN to GND 2.2V to 5.5V
PVIN Supply Voltage 0 to AVIN
SD Input Voltage 0 to AVIN
(1) At elevated temperatures, devices must be derated based on thermal resistance. The device in the SOIC-8 package must be derated at
θ
JA
= 151.2° C/W junction to ambient with no heat sink.
Electrical Characteristics
Specifications with standard typeface are for T
J
= 25°C and limits in boldface type apply over the full Operating
Temperature Range (T
J
= 0°C to +125°C)
(1)
. Unless otherwise specified, AVIN = PVIN = 2.5V, VDDQ = 2.5V
(2)
.
Symbol Parameter Conditions Min Typ Max Units
V
REF
V
REF
Voltage VIN = VDDQ = 2.3V 1.135 1.158 1.185
VIN = VDDQ = 2.5V 1.235 1.258 1.285 V
VIN = VDDQ = 2.7V 1.335 1.358 1.385
Z
VREF
V
REF
Output Impedance I
REF
= -30 to +30 μA 2.5 kΩ
V
TT
V
TT
Output Voltage I
OUT
= 0A
VIN = VDDQ = 2.3V 1.125 1.159 1.190
VIN = VDDQ = 2.5V 1.225 1.259 1.290
VIN = VDDQ = 2.7V 1.325 1.359 1.390
V
I
OUT
= ±1.5A
(3)
VIN = VDDQ = 2.3V 1.125 1.159 1.190
VIN = VDDQ = 2.5V 1.225 1.259 1.290
VIN = VDDQ = 2.7V 1.325 1.359 1.390
Vos
TT
/V
TT
V
TT
Output Voltage Offset I
OUT
= 0A -20 0 20
(V
REF
-V
TT
) I
OUT
= -1.5A
(3)
-25 0 25 mV
I
OUT
= +1.5A
(3)
-25 0 25
I
Q
Quiescent Current
(4)
I
OUT
= 0A
(1)
320 500 µA
Z
VDDQ
VDDQ Input Impedance 100 kΩ
I
SD
Quiescent Current in SD = 0V 115 150 µA
Shutdown
(4)
I
Q_SD
Shutdown Leakage Current SD = 0V 2 5 µA
V
IH
Minimum Shutdown High 1.9 V
Level
V
IL
Maximum Shutdown Low 0.8 V
Level
I
V
V
TT
Leakage Current in SD = 0V 1 10 µA
Shutdown V
TT
= 1.25V
I
SENSE
V
SENSE
Input Current 13 nA
T
SD
Thermal Shutdown See
(5)
165 Celcius
T
SD
_HYS Thermal Shutdown Hysteresis 10 Celcius
(1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation using
Statistical Quality Control (SQC) methods. The limits are used to calculate Texas Instruments' Average Outgoing Quality Level (AOQL).
(2) VIN is defined as VIN = AVIN = PVIN.
(3) V
TT
load regulation is tested by using a 10 ms current pulse and measuring V
TT
.
(4) Quiescent current defined as the current flow into AVIN.
(5) The maximum allowable power dissipation is a function of the maximum junction temperature, T
J(MAX)
, the junction to ambient thermal
resistance, θ
JA
, and the ambient temperature, T
A
. Exceeding the maximum allowable power dissipation will cause excessive die
temperature and the regulator will go into thermal shutdown.
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