Datasheet

LMZ23605
SNVS659H –MARCH 2011–REVISED OCTOBER 2013 www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ABSOLUTE MAXIMUM RATINGS
(1)(2)
VIN to PGND -0.3V to 40V
EN, SYNC to AGND -0.3V to 5.5V
SS/TRK, FB to AGND -0.3V to 2.5V
AGND to PGND -0.3V to 0.3V
Junction Temperature 150°C
Storage Temperature Range -65°C to 150°C
ESD Susceptibility
(3)
± 2 kV
Peak Reflow Case Temperature (30 sec) 245°C
For soldering specifications, refer to the following document: SNOA549
(1) Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which
operation of the device is intended to be functional. For ensured specifications and test conditions, see the Electrical Characteristics.
(2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and
specifications.
(3) The human body model is a 100pF capacitor discharged through a 1.5 kΩ resistor into each pin. Test method is per JESD-22-114.
OPERATING RATINGS
(1)
VIN 6V to 36V
EN, SYNC 0V to 5.0V
Operation Junction Temperature −40°C to 125°C
(1) Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which
operation of the device is intended to be functional. For ensured specifications and test conditions, see the Electrical Characteristics.
ELECTRICAL CHARACTERISTICS
Limits in standard type are for T
J
= 25°C only; limits in boldface type apply over the junction temperature (T
J
) range of -40°C
to +125°C. Minimum and Maximum limits are ensured through test, design or statistical correlation. Typical values represent
the most likely parametric norm at T
J
= 25°C, and are provided for reference purposes only. Unless otherwise stated the
following conditions apply: V
IN
= 12V, Vout = 3.3V
Symbol Parameter Conditions Min
(1)
Typ
(2)
Max
(1)
Units
SYSTEM PARAMETERS
Enable Control
V
EN
EN threshold trip point V
EN
rising 1.10 1.279 1.458 V
V
EN-HYS
EN input hysteresis current V
EN
> 1.279V –21 µA
Soft-Start
I
SS
SS source current V
SS
= 0V 40 50 60 µA
t
SS
Internal soft-start interval 1.6 msec
Current Limit
I
CL
Current limit threshold d.c. average 5.4 A
Internal Switching Oscillator
f
osc
Free-running oscillator frequency Sync input connected to ground. 711 812 914 kHz
f
sync
Synchronization range 650 950 kHz
V
IL-sync
Synchronization logic zero Relative to AGND 0.4 V
amplitude
V
IH-sync
Synchronization logic one Relative to AGND. 1.5 V
amplitude
Sync
d.c.
Synchronization duty cycle range 15 50 85 %
D
max
Maximum Duty Factor 83 %
(1) Min and Max limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlation
using Statistical Quality Control (SQC) methods. Limits are used to calculate Average Outgoing Quality Level (AOQL).
(2) Typical numbers are at 25°C and represent the most likely parametric norm.
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