Datasheet
LMZ12008
SNVS716F –MARCH 2011–REVISED OCTOBER 2013
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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings
(1)(2)
VIN to PGND -0.3V to 24V
EN to AGND -0.3V to 5.5V
SS, FB to AGND -0.3V to 2.5V
AGND to PGND -0.3V to 0.3V
Junction Temperature 150°C
Storage Temperature Range -65°C to 150°C
ESD Susceptibility
(3)
± 2 kV
Peak Reflow Case Temperature 245°C
(30 sec)
For soldering specifications, refer to the following document: www.ti.com/lit/snoa549c
(1) Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which
operation of the device is intended to be functional. For ensured specifications and test conditions, see the Electrical Characteristics.
(2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and
specifications.
(3) The human body model is a 100pF capacitor discharged through a 1.5 kΩ resistor into each pin. Test method is per JESD-22-114.
Operating Ratings
(1)
VIN 6V to 20V
EN 0V to 5.0V
Operation Junction Temperature −40°C to 125°C
(1) Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which
operation of the device is intended to be functional. For ensured specifications and test conditions, see the Electrical Characteristics.
Electrical Characteristics
Limits in standard type are for T
J
= 25°C only; limits in boldface type apply over the junction temperature (T
J
) range of -40°C
to +125°C. Minimum and Maximum limits are ensured through test, design or statistical correlation. Typical values represent
the most likely parametric norm at T
J
= 25°C, and are provided for reference purposes only. Unless otherwise stated the
following conditions apply: V
IN
= 12V, V
OUT
= 3.3V
(1)
Min Typ Max
Symbol Parameter Conditions Units
(2) (3) (2)
SYSTEM PARAMETERS
Enable Control
V
EN
EN threshold V
EN
rising 1.096 1.274 1.452 V
I
EN-HYS
EN hysteresis source current V
EN
> 1.274V 13 µA
Soft-Start
I
SS
SS source current V
SS
= 0V 40 50 60 µA
t
SS
Internal soft-start interval 1.6 msec
Current Limit
I
CL
Current limit threshold d.c. average 10.5 A
Internal Switching Oscillator
f
osc
Free-running oscillator frequency 314 359 404 kHz
Regulation and Over-Voltage Comparator
V
FB
In-regulation feedback voltage V
SS
>+ 0.8V 0.775 0.795 0.815 V
I
O
= 8A
V
FB-OV
Feedback over-voltage protection 0.86 V
threshold
(1) EN 55022:2006, +A1:2007, FCC Part 15 Subpart B, tested on Evaluation Board with EMI configuration
(2) Min and Max limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlation
using Statistical Quality Control (SQC) methods. Limits are used to calculate Average Outgoing Quality Level (AOQL).
(3) Typical numbers are at 25°C and represent the most likely parametric norm.
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