Datasheet

LMV951
www.ti.com SNOSAI3C –OCTOBER 2006–REVISED APRIL 2013
1V ELECTRICAL CHARACTERISTICS
(1)
Unless otherwise specified, all limits specified for at T
A
= 25°C, V
+
= 1, V
−
= 0V, V
CM
= 0.5V, Shutdown = 0V, and R
L
= 1
MΩ.Boldface limits apply at the temperature extremes.
Symbol Parameter Conditions Min
(2)
Typ
(3)
Max
(2)
Units
V
OS
Input Offset Voltage 1.5 2.8
mV
3.0
TC V
OS
Input Offset Average Drift 0.15 μV/°C
I
B
Input Bias Current 32 80 nA
85
I
OS
Input Offset Current 0.2 nA
CMRR Common Mode Rejection Ratio 0V ≤ V
CM
≤ 1V 67 77
55
dB
0.1V ≤ V
CM
≤ 1V 76 85
73
PSRR Power Supply Rejection Ratio 70 92
1V ≤ V
+
≤ 1.8V, V
CM
= 0.5V
67
dB
68 85
1V ≤ V
+
≤ 3V, V
CM
= 0.5V
65
V
CM
Input Common-Mode Voltage Range CMRR ≥ 67 dB 0 1.2
V
CMRR ≥ 55 dB 0 1.2
A
V
Large Signal Voltage Gain V
OUT
= 0.1V to 0.9V 90 106
R
L
= 600Ω to 0.5V 85
dB
V
OUT
= 0.1V to 0.9V 90 112
R
L
= 2 kΩ to 0.5V 86
V
OUT
Output Voltage Swing High R
L
= 600Ω to 0.5V 50 25
62
R
L
= 2 kΩ to 0.5V 25 12
36
mV from
rail
Output Voltage Swing Low R
L
= 600Ω to 0.5V 70 32
85
R
L
= 2 kΩ to 0.5V 35 10
40
I
OUT
Output Short Circuit Current
(4)
Sourcing 20 45
V
O
= 0V, V
IN(DIFF)
= ±0.2V 15
mA
Sinking 20 35
V
O
= 1V, V
IN(DIFF)
= ±0.2V 13
I
S
Supply Current Active Mode V
SD
<0.4V 370 480
520
μA
Shutdown Mode V
SD
>0.6V 0.01 1.0
3.0
SR Slew Rate See
(5)
1.4 V/μs
GBWP Gain Bandwidth Product 2.7 MHz
e
n
Input - Referred Voltage Noise f = 1 kHz 25 nV/√Hz
i
n
Input-Referred Current Noise f = 1 kHz 0.2 pA/√Hz
THD Total Harmonic Distortion f = 1 kHz, A
V
= 1, R
L
= 1 kΩ 0.02 %
I
SD
Shutdown Pin Current Active Mode, V
SD
= 0V .001 1
µA
Shutdown Mode, V
SD
= 1V .001 1
V
SD
Shutdown Pin Voltage Range Active Mode 0 0.4
V
Shutdown Mode 0.65 1
(1) Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions is very limited self-
heating of the device.
(2) All limits are specified by testing or statistical analysis.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4) The short circuit test is a momentary test, the short circuit duration is 1.5 ms
(5) Number specified is the average of the positive and negative slew rates.
Copyright © 2006–2013, Texas Instruments Incorporated Submit Documentation Feedback 3
Product Folder Links: LMV951