Datasheet

LMV931-N, LMV931-N-Q1, LMV932-N, LMV932-N-Q1
LMV934-N, LMV934-N-Q1
www.ti.com SNOS993M –NOVEMBER 2001–REVISED NOVEMBER 2013
2.7V DC Electrical Characteristics
Unles s otherwise specified, all limits guaranteed for T
J
= 25°C. V
+
= 2.7V, V
−
= 0V, V
CM
= V
+
/2, V
O
= V
+
/2 and R
L
> 1 MΩ.
Boldface limits apply at the temperature extremes. See
(1)
Symbol Parameter Condition Min Typ Max Units
(2) (3) (2)
V
OS
Input Offset Voltage LMV931-N (Single) 1 4
mV
6
LMV932-N (Dual) 1 5.5
mV
LMV934-N (Quad) 7.5
TCV
OS
Input Offset Voltage Average 5.5
μV/°C
Drift
I
B
Input Bias Current 15 35
nA
50
I
OS
Input Offset Current 8 25
nA
40
I
S
Supply Current (per channel) 105 190
μA
210
CMRR Common Mode Rejection Ratio LMV931-N, 0 ≤ V
CM
≤ 1.5V 60 81
2.3V ≤ V
CM
≤ 2.7V
(4)
55
LMV932-N and LMV934-N 55 80
0 ≤ V
CM
≤ 1.5V 50 dB
2.3V ≤ V
CM
≤ 2.7V
(4)
−0.2V ≤ V
CM
≤ 0V 50 74
2.7V ≤ V
CM
≤ 2.9V
PSRR Power Supply Rejection Ratio 1.8V ≤ V
+
≤ 5V 75 100
dB
V
CM
= 0.5V 70
V
CM
Input Common-Mode Voltage For CMRR T
A
= 25°C V
−
−0.2 −0.2 to 3.0 V
+
+0.2
Range Range ≥ 50dB
T
A
= −40°C to V
−
V
+
V
85°C
T
A
= 125°C V
−
+0.2 V
+
−0.2
A
V
Large Signal Voltage Gain R
L
= 600Ω to 1.35V, 87 104
LMV931-N (Single) V
O
= 0.2V to 2.5V 86
dB
R
L
= 2kΩ to 1.35V, 92 110
V
O
= 0.2V to 2.5V 91
Large Signal Voltage Gain R
L
= 600Ω to 1.35V, 78 90
LMV932-N (Dual) V
O
= 0.2V to 2.5V 75
dB
LMV934-N (Quad)
R
L
= 2kΩ to 1.35V, 81 100
V
O
= 0.2V to 2.5V 78
V
O
Output Swing R
L
= 600Ω to 1.35V 2.55 2.62
V
IN
= ±100mV 2.53
0.083 0.110
0.130
V
R
L
= 2kΩ to 1.35V 2.65 2.675
V
IN
= ±100mV 2.64
0.025 0.04
0.045
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No guarantee of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T
J
> T
A
. See Applications section for information of temperature derating of the device. Absolute
Maximum Ratings indicated junction temperature limits beyond which the device may be permanently degraded, either mechanically or
electrically.
(2) All limits are guaranteed by testing or statistical analysis.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on
shipped production material.
(4) For guaranteed temperature ranges, see Input Common-Mode Voltage Range specifications.
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