Datasheet
LMV851, LMV852, LMV854
SNOSAW1A –OCTOBER 2007–REVISED MARCH 2013
www.ti.com
5V Electrical Characteristics
(1)
Unless otherwise specified, all limits are specified for T
A
= 25°C, V
+
= 5V, V
−
= 0V, V
CM
= V
+
/2, and R
L
= 10 kΩ to V
+
/2.
Boldface limits apply at the temperature extremes.
Parameter Test Conditions Min
(2)
Typ
(3)
Max
(2)
Units
V
OS
Input Offset Voltage ±0.26 ±1
mV
See
(4)
±1.2
TCV
OS
Input Offset Voltage Drift
(5)
±0.4 ±2
μV/°C
See
(4)
I
B
Input Bias Current
(5)
0.1 10
pA
500
I
OS
Input Offset Current 1 pA
CMRR Common Mode Rejection Ratio −0.2V ≤ V
CM
≤ V
+
−1.2V 77 94
dB
76 See
(4)
PSRR Power Supply Rejection Ratio 2.7V ≤ V
+
≤ 5.5V, 75 93
dB
V
OUT
= 1V 74 See
(4)
EMIRR EMI Rejection Ratio, IN+ and IN−
(6)
V
RFpeak
= 100 mV
P
(−20 dBV
P
), 64
f = 400 MHz
V
RFpeak
= 100 mV
P
(−20 dBV
P
), 76
f = 900 MHz
dB
V
RFpeak
= 100 mV
P
(−20 dBV
P
), 84
f = 1800 MHz
V
RFpeak
= 100 mV
P
(−20 dBV
P
), 89
f = 2400 MHz
CMVR Input Common-Mode Voltage Range CMRR ≥ 77 dB −0.2 3.8 V
A
VOL
Large Signal Voltage Gain
(7)
R
L
= 2 kΩ, 105 118
V
OUT
= 0.15V to 2.5V, 102
V
OUT
= 4.85V to 2.5V
dB
R
L
= 10 kΩ, 105 120
V
OUT
= 0.1V to 2.5V, 102
V
OUT
= 4.9V to 2.5V
V
O
Output Swing High, R
L
= 2 kΩ to V
+
/2 34 39
(measured from V
+
) 47
mV
R
L
= 10 kΩ to V
+
/2 7 11
13
Output Swing Low, R
L
= 2 kΩ to V
+
/2 31 38
(measured from V
−
) 50
mV
R
L
= 10 kΩ to V
+
/2 7 12
15
I
O
Output Short Circuit Current Sourcing, V
OUT
= V
CM
, 60 65
V
IN
= 100 mV 48
mA
Sinking, V
OUT
= V
CM
, 58 62
V
IN
= −100 mV 44
I
S
Supply Current LMV851 0.43 0.52
0.60
LMV852 0.82 0.93
mA
1.09
LMV854 1.59 1.73
2.05
(1) Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using
statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4) The typical value is calculated by applying absolute value transform to the distribution, then taking the statistical average of the resulting
distribution
(5) This parameter is specified by design and/or characterization and is not tested in production.
(6) The EMI Rejection Ratio is defined as EMIRR = 20log ( V
RFpeak
/ΔV
OS
).
(7) The specified limits represent the lower of the measured values for each output range condition.
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