Datasheet

LMV796, LMV797
www.ti.com SNOSAU9D –MARCH 2006–REVISED MARCH 2013
2.5V Electrical Characteristics (continued)
Unless otherwise specified, all limits are specified for T
A
= 25°C, V
+
= 2.5V, V
−
= 0V, V
CM
= V
+
/2 = V
O
. Boldface limits apply
at the temperature extremes.
Min Typ Max
Symbol Parameter Conditions Units
(1) (2) (1)
80 94
CMRR Common Mode Rejection Ratio 0V ≤ V
CM
≤ 1.4V dB
75
2.0V ≤ V
+
≤ 5.5V, V
CM
= 0V 80 100
75
PSRR Power Supply Rejection Ratio dB
1.8V ≤ V
+
≤ 5.5V, V
CM
= 0V 80 98
CMRR ≥ 60 dB −0.3 1.5
CMVR Common Mode Voltage Range V
CMRR ≥ 55 dB -0.3 1.5
LMV796/LMV796Q 85 98
80
V
OUT
= 0.15V to 2.2V,
R
LOAD
= 2 kΩ to V
+
/2
LMV797 82 92
A
VOL
Open Loop Voltage Gain dB
78
V
OUT
= 0.15V to 2.2V, 88 110
R
LOAD
= 10 kΩ to V
+
/2 84
R
LOAD
= 2 kΩ to V
+
/2 25 75
82
Output Voltage Swing High
R
LOAD
= 10 kΩ to V
+
/2 20 65
71
mV from
V
OUT
either rail
30 75
R
LOAD
= 2 kΩ to V
+
/2
78
Output Voltage Swing Low
15 65
R
LOAD
= 10 kΩ to V
+
/2
67
Sourcing to V
−
35 47
V
IN
= 200 mV
(6)
28
I
OUT
Output Current mA
Sinking to V
+
7 15
V
IN
= –200 mV
(6)
5
LMV796/LMV796Q 0.95 1.30
1.65
I
S
Supply Current per Amplifier mA
LMV797 1.1 1.50
per channel 1.85
A
V
= +1, Rising (10% to 90%) 8.5
SR Slew Rate V/μs
A
V
= +1, Falling (90% to 10%) 10.5
GBW Gain Bandwidth 14 MHz
e
n
Input Referred Voltage Noise Density f = 1 kHz 6.2 nV/√Hz
i
n
Input Referred Current Noise Density f = 1 kHz 0.01 pA/√Hz
THD+N Total Harmonic Distortion + Noise f = 1 kHz, A
V
= 1, R
LOAD
= 600Ω 0.01 %
(6) The short circuit test is a momentary test, the short circuit duration is 1.5ms.
5V Electrical Characteristics
Unless otherwise specified, all limits are specified for T
A
= 25°C, V
+
= 5V, V
−
= 0V, V
CM
= V
+
/2 = V
O
. Boldface limits apply at
the temperature extremes.
Min Typ Max
Symbol Parameter Conditions Units
(1) (2) (1)
0.1 ±1.35
V
OS
Input Offset Voltage mV
±1.65
LMV796/LMV796Q
(3)
−1.0
TC V
OS
Input Offset Voltage Temperature Drift μV/°C
LMV797
(3)
−1.8
(1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the
statistical quality control (SQC) method.
(2) Typical values represent the parametric norm at the time of characterization.
(3) Offset voltage average drift is determined by dividing the change in V
OS
by temperature change.
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