Datasheet

LMV793, LMV794
SNOSAX6D –MARCH 2007–REVISED MARCH 2013 www.ti.com
5V Electrical Characteristics
(1)
Unless otherwise specified, all limits are specified for T
A
= 25°C, V
+
= 5V, V
−
= 0V, V
CM
= V
+
/2 = V
O
. Boldface limits apply at
the temperature extremes.
Symbol Parameter Conditions Min Typ Max Units
(2) (3) (2)
V
OS
Input Offset Voltage 0.1 ±1.35
mV
±1.65
TC V
OS
Input Offset Voltage Temperature Drift
(4)
LMV793 −1.0
μV/°C
LMV794 −1.8
I
B
Input Bias Current V
CM
= 2.0V
(5) (6)
−40°C ≤ T
A
≤ 85°C 0.1 1
25
pA
−40°C ≤ T
A
≤ 125°C 0.1 1
100
I
OS
Input Offset Current V
CM
= 2.0V
(6)
10 fA
CMRR Common Mode Rejection Ratio 0V ≤ V
CM
≤ 3.7V 80 100
dB
75
PSRR Power Supply Rejection Ratio 2.0V ≤ V
+
≤ 5.5V, V
CM
= 0V 80 100
75
dB
1.8V ≤ V
+
≤ 5.5V, V
CM
= 0V 80 98
CMVR Common Mode Voltage Range CMRR ≥ 60 dB −0.3 4
V
CMRR ≥ 55 dB -0.3 4
A
VOL
Open Loop Voltage Gain V
OUT
= 0.3V to 4.7V, LMV793 85 97
R
L
= 2 kΩ to V
+
/2 80
LMV794 82 89
dB
78
V
OUT
= 0.3V to 4.7V, 88 110
R
L
= 10 kΩ to V
+
/2 84
V
OUT
Output Voltage Swing High R
L
= 2 kΩ to V
+
/2 LMV793 35 75
82
LMV794 35 75
82
R
L
= 10 kΩ to V
+
/2 25 65
71
mV from
either rail
Output Voltage Swing Low R
L
= 2 kΩ to V
+
/2 LMV793 42 75
78
LMV794 45 80
83
R
L
= 10 kΩ to V
+
/2 20 65
67
I
OUT
Output Current Sourcing to V
−
45 60
V
IN
= 200 mV
(7)
37
mA
Sinking to V
+
10 21
V
IN
= –200 mV
(7)
6
I
S
Supply Current per Amplifier LMV793 1.15 1.40
1.75
mA
LMV794 per Channel 1.30 1.70
2.05
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T
J
> T
A
.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the
statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4) Offset voltage average drift is determined by dividing the change in V
OS
by temperature change.
(5) Positive current corresponds to current flowing into the device.
(6) This parameter is specified by design and/or characterization and is not tested in production.
(7) The short circuit test is a momentary test, the short circuit duration is 1.5 ms.
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