Datasheet

LMR24210
SNVS738G –OCTOBER 2011–REVISED APRIL 2013 www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings
(1)(2)
VIN, RON to AGND -0.3V to 43.5V
SW to AGND -0.3V to 43.5V
SW to AGND (Transient) -2V (< 100ns)
VIN to SW -0.3V to 43.5V
BST to SW -0.3V to 7V
All Other Inputs to AGND -0.3V to 7V
ESD Rating Human Body Model
(3)
±2kV
Storage Temperature Range -65°C to +150°C
Junction Temperature (T
J
) 150°C
(1) Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which
operation of the device is intended to be functional. For ensured specifications and test conditions, see the Electrical Characteristics.
(2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and
specifications.
(3) The human body model is a 100pF capacitor discharged through a 1.5kΩ resistor into each pin.
Operating Ratings
(1)
Supply Voltage Range (VIN) 4.5V to 42V
Junction Temperature Range (T
J
) −40°C to +125°C
Thermal Resistance (θ
JA
) 28-ball DSBGA
(2)
50°C/W
For soldering specifications see SNOA549
(1) Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which
operation of the device is intended to be functional. For ensured specifications and test conditions, see the Electrical Characteristics.
(2) θ
JA
calculations were performed in general accordance with JEDEC standards JESD51–1 to JESD51–11.
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