Datasheet
Table Of Contents
- FEATURES
- Applications
- Key Specifications
- DESCRIPTION
- Absolute Maximum Ratings
- Operating Ratings
- Electrical Characteristics
- Electrical Characteristics (Serial Interface)
- Electrical Characteristics (Diagnostic)
- Typical Performance Characteristics
- Functional Description
- Revision History

I
OL
I
OH
VDD/2
TO
SDO_DIAG
PIN
C
L
50 pF
LMP91200
www.ti.com
SNAS571C –JANUARY 2012–REVISED MARCH 2013
Electrical Characteristics (Serial Interface)
(1)
(continued)
Unless otherwise specified. All limits specified for T
A
=25°C, V
S
=(VDD-GND)=3.3V.
Symbol Parameter Condition Min
(2)
Typ
(3)
Max
(2)
Units
t8 CSB Inactive 50 ns
See
(4)
Hold Time, SCLK Transition to
t9 10 ns
CSB Falling Edge
SDO_DIAG Signal Rise and Fall
t
R
/t
F
Diagnostic disabled
(4)(5)
30 ns
Times
(5) This parameter is specified by design and/or characterization and is not tested in production.
Electrical Characteristics (Diagnostic)
(1)
Unless otherwise specified. All limits specified for T
A
=25°C, V
S
=(VDD-GND)=3.3V.
Symbol Parameter Condition Min
(2)
Typ
(3)
Max
(2)
Units
DIAG_t
SET
SDO_DIAG setup time
(4)
200 ns
Diagnostic Rise and Fall
DIAG_t
R
/DIAG_t
F
Times (Signal at SDO_DIAG 30 ns
pin, in Diagnostic Mode)
(4)
Minimum t
ON
of the diagnostic
DIAG_t
ON
pulse at SDO_DIAG pin in 100 ns
Diagnostic Mode
(4)
Positve Diagnostic pulse Base pulse = VCM;
VCM_DIAG
POS
165 mV
amplitude
(4)
High level pulse = VCM+5%VREF
Negative Diagnostic pulse Base pulse = VCM;
VCM_DIAG
NEG
165 mV
amplitude
(4)
High level pulse = VCM-5%VREF
VCM_DIAG_acc Diagnostics Pulse accuracy
(4)
0.1 %
VCM_DIAG
t
R
Diagnostics Pulse rise time
(4)
10% to 90%, C = 15pF 10 us
VCM_DIAG
t
F
Diagnostics Pulse fall time
(4)
90% to 10%, C=15pF 10 us
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where TJ >TA.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the
Statistical Quality Control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(4) This parameter is specified by design and/or characterization and is not tested in production.
Test Circuit Diagrams
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