Datasheet

LMP91200
www.ti.com SNAS571C –JANUARY 2012–REVISED MARCH 2013
Electrical Characteristics
(1)(2)(3)
(continued)
Unless otherwise specified, all limits specified for T
A
= 25°C. V
S
=(VDD-GND)=3.3V. VREF=3.3V. Boldface limits apply at the
temperature extremes.
Symbol Parameter Condition Min
(4)
Typ
(5)
Max
(4)
Units
Input referred noise (high
en
pH
f=1kHz 90 nV/√Hz
frequency)
(9)
Sourcing, Vout to GND, INP=1.65V 10 13 mA
Isc
pH
Output short circuit current
(11)
Sinking, Vout to VDD, INP=1.65V 8 12 mA
VCM Buffer
VCMHI_acc VCMHI accuracy -1.6 1.6 mV
VCMHI temperature
Tc_VCMHI -40°C<T
A
<125°C -18 -5 8 µV/°C
coefficient
(9)(12)
VCMHI_acc_V
VCMHI_acc vs. VREF
(9)(13)
1.8V<VREF<5.0V -500 -100 300 µV/V
REF
Rout
VCMHI
VCMHI Output Impedance
(9)
VCMHI=1/2 VREF 250 KΩ
VCMHI=1/2 VREF,
Aol
VCM
Open loop Gain
(6)
90 120 dB
300mV<VCM<VDD-300mV
-200 200
VCMHI=1/8 VREF
-350 350
Vos
VCM
(VCM-VCMHI)
(6)
µV
-200 200
VCMHI=7/8 VREF
-350 350
VCMHI=1/8 VREF -2.5 2.5
Input offset voltage drif ot (VCM-
TcVos
VCM
µV/°C
VCMHI)
(8)(9)
VCMHI=7/8 VREF -2.5 2.5
Zout
VCM
Output Impedance
(9)
f=1KHz 4 Ω
1.8V<VDD<5V,
80
VCMHI=1/8VREF
PSRR
VCM
DC_Power supply rejection ratio dB
1.8V<VDD<5V,
80
VCMHI=7/8VREF
Input referred noise (low
En_RMS
VCM
Integrated 0.1Hz to 10Hz 2.6 µV
PP
frequency)
(9)
Input referred noise (high
en
VCM
f=1KHz 90 nV/√Hz
frequency)
(14)
Sourcing, Vout to GND
10 16
VCMHI=1/2VREF
Isc
VCM
Output short circuit current
(15)
mA
Sinking, Vout to VDD
8 12
VCMHI=1/2VREF
Current Source
100
200
I
CS
Current Source I
CAL
, I
RTD
Programmable current µA
1000
2000
Input referred noise (low
In_RMS
CS
Integrated 0.1Hz to 10Hz 33 nA
PP
frequency)
(14)
Input referred noise (high
in
CS
f=1KHz 120 pA/√Hz
frequency)
(14)
TcI
CS
Current Source drift
(14)(16)
-200 ±35 200 ppm/°C
I_acc
CS
Current Source accuracy -2.5 1 2.5 %
(11) The short circuit test is a momentary open loop test.
(12) VCMHI voltage average drift is determined by dividing the change in VCMHI at the temperature extremes by the total temperature
change.
(13) VCMHI_acc vs. VREF is determined by dividing the change in VCMHI_acc at the VREF extremes by the total VREF change.
(14) This parameter is specified by design and/or characterization and is not tested in production.
(15) The short circuit test is a momentary open loop test.
(16) Current source drift is determined by dividing the change in I
CS
at the temperature extremes by the total temperature change.
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