Datasheet

LMP91200
SNAS571C –JANUARY 2012–REVISED MARCH 2013 www.ti.com
Electrical Characteristics
(1)(2)(3)
Unless otherwise specified, all limits specified for T
A
= 25°C. V
S
=(VDD-GND)=3.3V. VREF=3.3V. Boldface limits apply at the
temperature extremes.
Symbol Parameter Condition Min
(4)
Typ
(5)
Max
(4)
Units
Power supply
54
pH measurement mode 50
59
Temperature measurement mode, 325
300
I
CS
=100uA 330
Temperature measurement mode, 432
Is Supply Current
(6)(7)
400 µA
I
CS
=200uA 437
Temperature measurement mode, 364
350
I
CS
=1000uA 372
Temperature measurement mode, 477
470
I
CS
=2000uA 477
pH Buffer
INP=1.65V, 300mV = VOUT = VDD-
Aol
pH
Open loop Gain 90 120 dB
300mV
-200 200
INP=1/8VREF
-350 350
Vos
pH
Input Voltage Offset
(6)
µV
-200 200
INP=7/8VREF
-350 350
INP=1/8VREF -2.5 2.5
TcVos
pH
Input offset voltage drift
(8)(9)
uV/°C
INP=7/8VREF -2.5 2.5
VOS
pH_drift
Long term V
OSpH
drift
(10)
500 hours OPL 150 µV
0V<INP<3.3V -125 125 fA
0V<INP<3.3V, 85°C -445 445 fA
0V<INP<3.3V, 125°C -1.5 1.5 pA
-500mV<(INP-VCM)<500mV, V
S
=0V. -600 600 fA
Ib
pH
Input bias current at INP
(9)
-500mV<(INP-VCM)<500mV,
-6.5 6.5 pA
85°C, V
S
=0V.
-500mV<(INP-VCM)<500mV,
-100 100 pA
125°C, V
S
=0V.
GBWP
pH
Gain Bandwidth Product
(9)
C
L
=10pF, R
L
=1Mohm 220 KHz
DC_Common mode rejection
CMRR
pH
1/8VREF<INP<7/8VREF 80 dB
ratio
1.8V<VDD<5V
80
INP=1/8VREF
PSRR
pH
DC_Power supply rejection ratio dB
1.8V<VDD<5V
80
INP=7/8VREF
Input referred noise (low
En_RMS
pH
Integrated 0.1Hz to 10Hz 2.6 µV
PP
frequency)
(9)
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where TJ >TA.
(2) Positive current corresponds to current flowing into the device.
(3) The voltage on any pin should not exceed 6V relative to any other pins.
(4) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the
Statistical Quality Control (SQC) method.
(5) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(6) Boldface limits are production tested at 125°C. Limits are specified through correlations using the Statistical Quality Control (SQC)
method.
(7) Excluding all currents which flows out from the device.
(8) Offset voltage average drift is determined by dividing the change in V
OS
at the temperature extremes by the total temperature change.
(9) This parameter is specified by design and/or characterization and is not tested in production.
(10) Offset voltage long term drift is determined by dividing the change in V
OS
at time extremes of OPL procedure by the length of the OPL
procedure. OPL procedure: 500 hours at 150°C are equivalent to about 15 years.
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