Datasheet

LMP91000
SNAS506H –JANUARY 2011–REVISED MARCH 2013 www.ti.com
Electrical Characteristics
(1)
(continued)
Unless otherwise specified, all limits guaranteed for T
A
= 25°C, V
S
=(VDD – AGND), V
S
=3.3V and AGND = DGND =0V,
VREF= 2.5V, Internal Zero= 20% VREF. Boldface limits apply at the temperature extremes.
Parameter Test Conditions Min
(2)
Typ
(3)
Max
(2)
Units
TIA_GAIN Transimpedance gain accuracy 5 %
Linearity ±0.05 %
Programmable TIA Gains 7 programmable gain resistors 2.75
3.5
7
14
kΩ
35
120
350
Maximum external gain resistor 350
TIA_ZV Internal zero voltage 3 programmable percentages of VREF 20
50
67
%
3 programmable percentages of VDD 20
50
67
Internal zero voltage Accuracy ±0.04 %
RL Programmable Load 4 programmable resistive loads 10
33
Ω
50
100
Load accuracy 5 %
2.7 ≤VDD≤5.25V Internal zero 20% VREF
Power Supply Rejection Ratio at
PSRR Internal zero 50% VREF 80 110 dB
RE pin
Internal zero 67% VREF
TEMPERATURE SENSOR SPECIFICATION (Refer to Table 1 in the Function Description for details)
Temperature Error TA=-40˚C to 85˚C -3 3 °C
Sensitivity TA=-40˚C to 85˚C -8.2 mV/°C
Power on time 1.9 ms
EXTERNAL REFERENCE SPECIFICATION
VREF External Voltage reference range 1.5 VDD V
Input impedance 10 MΩ
I
2
C Interface
(1)
Unless otherwise specified, all limits guaranteed for at T
A
= 25°C, V
S
=(VDD – AGND), 2.7V <V
S
< 5.25V and AGND = DGND
=0V, VREF= 2.5V. Boldface limits apply at the temperature extremes
Parameter Test Conditions Min
(2)
Typ
(3)
Max
(2)
Units
V
IH
Input High Voltage 0.7*VDD V
V
IL
Input Low Voltage 0.3*VDD V
V
OL
Output Low Voltage I
OUT
=3mA 0.4 V
Hysteresis
(4)
0.1*VDD V
C
IN
Input Capacitance on all digital pins 0.5 pF
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No guarantee of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T
J
> T
A
. Absolute Maximum Ratings indicate junction temperature limits beyond which the
device may be permanently degraded, either mechanically or electrically.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlations using
statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on
shipped production material.
(4) This parameter is guaranteed by design or characterization.
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