Datasheet

LMP91000
SNAS506H –JANUARY 2011–REVISED MARCH 2013 www.ti.com
Electrical Characteristics
(1)
Unless otherwise specified, all limits guaranteed for T
A
= 25°C, V
S
=(VDD – AGND), V
S
=3.3V and AGND = DGND =0V,
VREF= 2.5V, Internal Zero= 20% VREF. Boldface limits apply at the temperature extremes.
Parameter Test Conditions Min
(2)
Typ
(3)
Max
(2)
Units
POWER SUPPLY SPECIFICATION
I
S
Supply Current 3-lead amperometric cell mode 15
10
MODECN = 0x03 13.5
Standby mode 10
6.5
MODECN = 0x02 8
Temperature Measurement mode with TIA OFF 15
11.4
MODECN = 0x06 13.5
µA
Temperature Measurement mode with TIA ON 20
14.9
MODECN = 0x07 18
2-lead ground referred galvanic cell mode
9
VREF=1.5V 6.2
8
MODECN = 0x01
Deep Sleep mode 1
0.6
MODECN = 0x00 0.85
POTENTIOSTAT
Bias_RW Bias Programming range Percentage of voltage referred to VREF or VDD
(differential voltage between RE ±24 %
pin and WE pin)
Bias Programming Resolution First two smallest step ±1
%
All other steps ±2
VDD=2.7V; -90 90
Internal Zero 50% VDD -800 800
I
RE
Input bias current at RE pin pA
VDD=5.25V; -90 90
Internal Zero 50% VDD -900 900
I
CE
Minimum operating current sink 750
µA
capability
source 750
Minimum charging capability
(4)
sink 10
mA
source 10
AOL_A1 Open loop voltage gain of control 300mV≤VCE≤Vs-300mV;
104 120 dB
loop op amp (A1) -750µA≤ICE≤750µA
en_RW Low Frequency integrated noise 0.1Hz to 10Hz, Zero Bias
3.4
between RE pin and WE pin
(5)
µVpp
0.1Hz to 10Hz, with Bias
5.1
(5) (6)
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No guarantee of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T
J
> T
A
. Absolute Maximum Ratings indicate junction temperature limits beyond which the
device may be permanently degraded, either mechanically or electrically.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlations using
statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on
shipped production material.
(4) At such currents no accuracy of the output voltage can be expected.
(5) This parameter includes both A1 and TIA's noise contribution.
(6) In case of external reference connected, the noise of the reference has to be added.
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