Datasheet

LMP8645, LMP8645HV
SNOSB29F –NOVEMBER 2009–REVISED MARCH 2013 www.ti.com
5V Electrical Characteristics
(1)
Unless otherwise specified, all limits specified for at T
A
= 25°C, V
S
=V
+
-V
-
, V
+
= 5V, V
−
= 0V, −2V < V
CM
< 76V, R
g
= 25kΩ, R
L
= 10 MΩ. Boldface limits apply at the temperature extremes.
Symbol Parameter Condition Min
(2)
Typ
(3)
Max
(2)
Units
V
OS
Input Offset Voltage V
CM
= 2.1V -1 1
mV
-1.7 1.7
TCV
OS
Input Offset Voltage Drift
(4)(5)
V
CM
= 2.1V 7 μV/°C
I
B
Input Bias Current
(6)
V
CM
= 2.1V 12.5 22 μA
e
ni
Input Voltage Noise
(5)
f > 10 kHz, R
G
= 5 kΩ 120 nV/√Hz
V
SENSE(MAX)
Max Input Sense Voltage
(5)
V
CM
= 12V, R
G
= 5 kΩ 600 mV
Gain A
V
Adjustable Gain Setting
(5)
V
CM
= 12V 1 100 V/V
Gm Transconductance V
CM
= 2.1V 200 µA/V
Accuracy V
CM
= 2.1V -2 2 %
-3.4 3.4
Gm drift
(5)
−40°C to 125°C, V
CM
= 2.1V 140 ppm /°C
PSRR Power Supply Rejection Ratio V
CM
= 2.1V, , 2.7V < V
+
< 12V 90 dB
CMRR Common Mode Rejection Ratio LMP8645HV 2.1V <V
CM
< 76V 95
LMP8645 2.1V <V
CM
< 42V
dB
-2V < V
CM
< 2V 60
BW −3 dB Bandwidth
(5)
R
G
= 10 kΩ, C
G
= 4 pF V
SENSE
= 400 mV, 850
C
L
= 30 pF, R
L
= 1MΩ
R
G
= 25 kΩ, C
G
= 4 pF, V
SENSE
= 300 mV, 260
kHz
C
L
= 30 pF, R
L
= 1MΩ
R
G
= 50 kΩ, C
G
= 4 pF, V
SENSE
= 300mV, 140
C
L
= 30 pF, R
L
= 1MΩ
SR Slew Rate
(7)(5)
V
CM
= 5V, C
G
= 4 pF, V
SENSE
from 100 mV 0.5 V/µs
to 500 mV, C
L
= 30 pF, R
L
= 1MΩ
I
S
Supply Current V
CM
= 2.1V 450 610
780
uA
V
CM
= −2V 2100 2800
3030
V
OUT
Maximum Output Voltage V
CM
=5V, Rg= 500 kΩ 3.3 V
Minimum Output Voltage V
CM
=2.1V 22 mV
I
OUT
Output current
(5)
Sourcing, V
OUT
= 1.65V, Rg= 150kΩ 5
mA
Sinking, V
OUT
= 1.65V, Rg= 150kΩ 5
C
LOAD
Max Output Capacitance Load
(5)
30 pF
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T
J
> T
A
.
(2) All limits are specified by testing, design, or statistical analysis.
(3) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and
will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production
material.
(4) Offset voltage temperature drift is determined by dividing the change in V
OS
at the temperature extremes by the total temperature
change.
(5) This parameter is specified by design and/or characterization and is not tested in production.
(6) Positive Bias Current corresponds to current flowing into the device.
(7) The number specified is the average of rising and falling slew rates and measured at 90% to 10%.
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