Datasheet

LMP8358
SNOSB09B –APRIL 2010–REVISED MARCH 2013 www.ti.com
5.0V Electrical Characteristics (continued)
Unless otherwise specified, all limits are ensured for T
A
= 25°C. V
+
= 5.0V , V
−
= 0V, V
REF
= V
+
/2, V
CM
= V
+
/2, R
L
= 10 kΩ to
V
REF
, C
L
= 10 pF; Serial Control Register: G[2:0] = 110b (Gain = 1000x), COMP[2:0] = 000b, MUX[1:0] = 00b, POL, SHDN,
FILT, PIN = 0b, CUR[2:0] = 000b. Boldface limits apply at the temperature extremes.
Symbol Parameter Conditions Min
(1)
Typ
(2)
Max
(1)
Units
I
TEST
Fault Detection: Test Current Setting 1 (CUR[2:0] = 001b), V
CM
< V
+
− 10 nA
2.25V
Setting 2 (CUR[2:0] = 010b), V
CM
< V
+
− 100 nA
2.25V
Setting 3 (CUR[2:0] = 011b), V
CM
< V
+
− 1 µA
2.25V
Setting 4 (CUR[2:0] = 100b), V
CM
< V
+
− 10 µA
2.25V
Setting 5 (CUR[2:0] = 101b), V
CM
< V
+
− 100 µA
2.25V
Electrical Characteristics (Serial Interface)
Unless otherwise specified, all limits ensured for T
A
= 25°C, V
+
− V
−
≥ 2.7V, V
+
≥ VHSER/VLPAR, V
−
≤ VLSER/VHPAR, V
D
=
(VHSER/VLPAR) − (VLSER/VHPAR) ≥ 2.5V.
Symbol Parameter Conditions Min
(1)
Typ
(2)
Max
(1)
Units
V
IL
Input Logic Low Threshold 0.3 × V
D
V
V
IH
Input Logic High Threshold 0.7 × V
D
V
V
OL
Output Logic Low Threshold I
SDO
= 2mA 0.2 V
V
OH
Output Logic High Threshold I
SDO
= 2mA V
D
− 0.2V
I
SDO
Output Source Current, SDO V
D
= 3.3V or 5.0V, −2
CSB = 0V, V
OH
= V
+
– 0.7V
mA
Output Sink Current, SDO V
D
= 3.3V or 5.0V, 2
CSB = 0V, V
OL
= 1.0V
I
OZ
Output Tri-state Leakage Current, V
D
= 3.3V or 5.0V, ±1 µA
SDO CSB = V
D
= 3.3V or 5V
t
1
High Period, SCK
(3)
100 ns
t
2
Low Period, SCK
(3)
100 ns
t
3
Set Up Time, CSB to SCK
(3)
50 ns
t
4
Set Up Time, SDI to SCK
(3)
30 ns
t
5
Hold Time, SCK to SDI
(3)
10 ns
t
6
Prop. Delay, SCK to SDO
(3)
60 ns
t
7
Hold Time, SCK Transition to CSB
(3)
50 ns
Rising Edge
t
8
CSB Inactive
(3)
50 ns
t
9
Prop. Delay, CSB to SDO Active
(3)
50 ns
t
10
Prop. Delay, CSB to SDO Inactive
(3)
50 ns
t
11
Hold Time, SCK Transition to CSB
(3)
10 ns
Falling Edge
t
r
/t
f
Signal Rise and Fall Times
(3)
1.5 5 ns
(1) All limits are specified by testing or statistical analysis.
(2) Typical Values indicate the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(3) Load for these tests is shown in the Timing Diagram Test Circuit.
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