Datasheet

LMP8350
SNOSB80B –FEBRUARY 2011–REVISED MARCH 2013 www.ti.com
+5V Electrical Characteristics
(1)
Unless otherwise specified, all limits are ensured for T
A
= 25°C, Avcl = +1, R
F
=R
G
= 1kΩ, Fully differential input, V
S
= +5V, R
L
= 2 kΩ//20pF differentially, Input CMR and V
OCM
=mid supply and HP mode unless otherwise noted. Boldface limits apply at
the temperature extremes.
Symbol Parameter Conditions Min
(2)
Typ
(3)
Max
(2)
Units
5V DC Characteristics
V
OS
Input Offset Voltage ±3.2
High Power ±0.2
(RTI) ±3.6
±2.0
Mid Power ±0.1 mV
±2.3
±2.0
Low Power ±0.1
±2.3
TCV
OS
Input Offset Voltage vs.Temperature
(4)
High Power ±0.7
Mid Power ±0.5 μV/°C
Low Power ±0.4
I
B
Input Bias Current 1.5
High Power
1.6
2.5
Mid Power μA
3.0
3.5
Low Power
3.7
A
VOL
Open Loop Gain High Power 63 68
Mid Power 71 75 dB
Low Power 68 75
CMVR Common Mode Voltage Range
(5)
HP @ CMRR ≥60dB 1.15 3.85
MP @ CMRR ≥86dB 1.15 3.85 V
LP @ CMRR ≥80dB 1.15 3.85
CMRR Common Mode Rejection Ratio DC, V
OCM
=0,VID=0,
ΔVcm=±0.2V
High Power 63 79
dB
Mid Power 87 114
Low Power 82 114
Z
IND
Differential Input Resistance V
CM
= mid supply 0.48 MΩ
C
IND
Differential Input Capacitance V
CM
= mid supply 1 pF
V
O
Output Swing 0.77 to
High Power 0.82 4.18
(Single Ended) 4.23
0.75 to
Mid Power 0.82 4.18 V
4.25
0.77 to
Low Power 0.83 4.17
4.23
I
SHORT
Short-Circuit Current Output Shorted to mid supply
(6)
High Power +44 / –25 +72 / –42
mA
Mid Power +34 / –16 +57 / –31
Low Power +12 / –5 +23 / –13
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where T
J
> T
A
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlations using the
Statistical Quality Control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4) Drift Determined by dividing the change in parameter at temperature extremes by the total temperature change. Value is the worst case
of Ta
MIN
to 25°C and 25°C to Ta
MAX
.
(5) At amplifier inputs.
(6) The short circuit test is a momentary test which applies to both single-supply and split-supply operation. Continuous short circuit
operation at elevated ambient temperature can exceed the maximum allowable junction temperature of 150°C. Positive number (+) is
sourcing, negative number (-) is sinking.
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