Datasheet

LMP7732
www.ti.com SNOSAZ0E –AUGUST 2007–REVISED MARCH 2013
3.3V Electrical Characteristics
(1)
Unless otherwise specified, all limits are ensured for T
A
= 25°C, V
+
= 3.3V, V
−
= 0V, V
CM
= V
+
/2, R
L
> 10 kΩ to V
+
/2. Boldface
limits apply at the temperature extremes.
Symbol Parameter Conditions Min
(2)
Typ
(3)
Max
(2)
Units
±500
V
CM
= 2.5V ±6
±600
V
OS
Input Offset Voltage
(4)
μV
±500
V
CM
= 0.5V ±6
±600
V
CM
= 2.5V ±0.5 ±5.5
Input Offset Voltage Temperature
TCV
OS
μV/°C
Drift
V
CM
= 0.5V ±0.2 ±5.5
±30
V
CM
= 2.5V ±1.5
±45
I
B
Input Bias Current nA
±50
V
CM
= 0.5V ±13
±77
±50
V
CM
= 2.5V ±1
±70
I
OS
Input Offset Current nA
±60
V
CM
= 0.5V ±11
±80
TCI
OS
Input Offset Current Drift V
CM
= 0.5V and V
CM
= 2.5V 0.048 nA/°C
0.15V ≤ V
CM
≤ 0.7V 101
120
0.23V ≤ V
CM
≤ 0.7V 89
CMRR Common Mode Rejection Ratio dB
1.5V ≤ V
CM
≤ 3.15V 105
130
1.5V ≤ V
CM
≤ 3.07V 99
2.5V ≤ V
+
≤ 5.0V 105 113
101
PSRR Power Supply Rejection Ratio dB
1.8V ≤ V
+
≤ 5.5V 111
CMVR Common Mode Voltage Range Large Signal CMRR ≥ 80 dB 0 3.3 V
R
L
= 10 kΩ to V
+
/2 112
130
V
OUT
= 0.5V to 2.8V 104
A
VOL
Open Loop Voltage Gain dB
R
L
= 2 kΩ to V
+
/2 110
119
V
OUT
= 0.5V to 2.8V 92
50
R
L
= 10 kΩ to V
+
/2 5
75
Output Voltage Swing High
50
R
L
= 2 kΩ to V
+
/2 14
75
mV from
V
OUT
either rail
50
R
L
= 10 kΩ to V
+
/2 9
75
Output Voltage Swing Low
50
R
L
= 2 kΩ to V
+
/2 13
75
Sourcing, V
OUT
= V
+
/2 28
45
V
IN
(diff) = 100 mV 22
I
OUT
Output Current mA
Sinking, V
OUT
= V
+
/2 25
48
V
IN
(diff) = −100 mV 20
5.6
V
CM
= 2.5V 4.2 mA
7.0
I
S
Supply Current
6.4
V
CM
= 0.5V 4.8
8.0
A
V
= +1, C
L
= 10 pF, R
L
= 10 kΩ to
SR Slew Rate V
+
/2 2.4 V/μs
V
OUT
= 2 V
PP
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where T
J
> T
A
. Absolute maximum Ratings indicate junction temperature limits beyond
which the device maybe permanently degraded, either mechanically or electrically.
(2) All limits are specified by testing, statistical analysis or design.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4) Ambient production test is performed at 25°C with a variance of ±3°C.
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