Datasheet

LMP7731
www.ti.com SNOSAT6E –JULY 2007–REVISED MARCH 2013
3.3V Electrical Characteristics
(1)
(continued)
Unless otherwise specified, all limits are ensured for T
A
= 25°C, V
+
= 3.3V, V
−
= 0V, V
CM
= V
+
/2, R
L
> 10 kΩ to V
+
/2. Boldface
limits apply at the temperature extremes.
Parameter Test Conditions Min
(2)
Typ
(3)
Max
(2)
Units
GBW Gain Bandwidth C
L
= 20 pF, R
L
= 10 kΩ to V
+
/2 22 MHz
G
M
Gain Margin C
L
= 20 pF, R
L
= 10 kΩ to V
+
/2 14 dB
Φ
M
Phase Margin C
L
= 20 pF, R
L
= 10 kΩ to V
+
/2 62 deg
Differential Mode 38 kΩ
R
IN
Input Resistance
Common Mode 151 MΩ
THD+N Total Harmonic Distortion + Noise A
V
= 1, f = 1 kHz, Amplitude = 1V, 0.002 %
f = 1 kHz, V
CM
= 2.5V 2.9
Input Referred Voltage Noise
nV/√Hz
Density
e
n
f = 1 kHz, V
CM
= 0.5V 2.9
Input Voltage Noise 0.1 Hz to 10 Hz 65 nV
PP
f = 1 kHz, V
CM
= 2.5V 1.1
Input Referred Current Noise
i
n
pA/√Hz
Density
f = 1 kHz, V
CM
= 0.5V 2.1
5V Electrical Characteristics
(1)
Unless otherwise specified, all limits are ensured for T
A
= 25°C, V
+
= 5V, V
−
= 0V, V
CM
= V
+
/2, R
L
> 10 kΩ to V
+
/2. Boldface
limits apply at the temperature extremes.
Parameter Test Conditions Min
(2)
Typ
(3)
Max
(2)
Units
±500
V
CM
= 4.5V ±6
±600
Input Offset Voltage
V
OS
μV
(4)
±500
V
CM
= 0.5V ±6
±600
V
CM
= 4.5V ±0.5 ±5.5
Input Offset Voltage Temperature
TCV
OS
μV/°C
Drift
V
CM
= 0.5V ±0.2 ±5.5
±30
V
CM
= 4.5V ±1.5
±50
I
B
Input Bias Current nA
±50
V
CM
= 0.5V ±14
±85
±50
V
CM
= 4.5V ±1
±70
I
OS
Input Offset Current nA
±65
V
CM
= 0.5V ±11
±80
TCI
OS
Input Offset Current Drift V
CM
= 0.5V and V
CM
= 4.5V 0.0482 nA/°C
0.15V ≤ V
CM
≤ 0.7V 101
120
0.23V ≤ V
CM
≤ 0.7V 89
CMRR Common Mode Rejection Ratio dB
1.5V ≤ V
CM
≤ 4.85V 105
130
1.5V ≤ V
CM
≤ 4.77V 99
111
2.5V ≤ V
+
≤ 5V 129
105
PSRR Power Supply Rejection Ratio dB
1.8V ≤ V
+
≤ 5.5V 117
CMVR Common Mode Voltage Range Large Signal CMRR ≥ 80 dB 0 5 V
R
L
= 10 kΩ to V
+
/2 112
130
V
OUT
= 0.5V to 4.5V 104
A
VOL
Open Loop Voltage Gain dB
R
L
= 2 kΩ to V
+
/2 110
119
V
OUT
= 0.5V to 4.5V 94
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T
J
> T
A
. Absolute maximum Ratings indicate junction temperature limits beyond which the
device maybe permanently degraded, either mechanically or electrically.
(2) All limits are specified by testing, statistical analysis or design.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4) Ambient production test is performed at 25°C with a variance of ±3°C.
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