Datasheet

LMP7731
SNOSAT6E –JULY 2007–REVISED MARCH 2013 www.ti.com
3.3V Electrical Characteristics
(1)
Unless otherwise specified, all limits are ensured for T
A
= 25°C, V
+
= 3.3V, V
−
= 0V, V
CM
= V
+
/2, R
L
> 10 kΩ to V
+
/2. Boldface
limits apply at the temperature extremes.
Parameter Test Conditions Min
(2)
Typ
(3)
Max
(2)
Units
±500
V
CM
= 2.5V ±6
±600
Input Offset Voltage
V
OS
μV
(4)
±500
V
CM
= 0.5V ±6
±600
V
CM
= 2.5V ±0.5 ±5.5
Input Offset Voltage Temperature
TCV
OS
μV/°C
Drift
V
CM
= 0.5V ±0.2 ±5.5
±30
V
CM
= 2.5V ±1.5
±45
I
B
Input Bias Current nA
±50
V
CM
= 0.5V ±13
±77
±50
V
CM
= 2.5V ±1
±70
I
OS
Input Offset Current nA
±60
V
CM
= 0.5V ±11
±80
TCI
OS
Input Offset Current Drift V
CM
= 0.5V and V
CM
= 2.5V 0.048 nA/°C
0.15V ≤ V
CM
≤ 0.7V 101
120
0.23V ≤ V
CM
≤ 0.7V 89
CMRR Common Mode Rejection Ratio dB
1.5V ≤ V
CM
≤ 3.15V 105
130
1.5V ≤ V
CM
≤ 3.07V 99
111
2.5V ≤ V
+
≤ 5.0V 129
105
PSRR Power Supply Rejection Ratio dB
1.8V ≤ V
+
≤ 5.5V 117
CMVR Common Mode Voltage Range Large Signal CMRR ≥ 80 dB 0 3.3 V
R
L
= 10 kΩ to V
+
/2 112
130
V
OUT
= 0.5V to 2.8V 104
A
VOL
Open Loop Voltage Gain dB
R
L
= 2 kΩ to V
+
/2 110
119
V
OUT
= 0.5V to 2.8V 92
50
R
L
= 10 kΩ to V
+
/2 5
75
Output Voltage Swing High
50
R
L
= 2 kΩ to V
+
/2 14
75
mV from
V
OUT
either rail
50
R
L
= 10 kΩ to V
+
/2 9
75
Output Voltage Swing Low
50
R
L
= 2 kΩ to V
+
/2 13
75
Sourcing, V
OUT
= V+/2 28
45
V
IN
(diff) = 100 mV 22
I
OUT
Output Current mA
Sinking, V
OUT
= V+/2 25
48
V
IN
(diff) = -100 mV 20
2.8
V
CM
= 2.5V 2.1
3.5
Supply Current
I
S
mA
(Per Channel)
3.2
V
CM
= 0.5V 2.4
4.0
A
V
= +1, C
L
= 10 pF, R
L
= 10 kΩ to
SR Slew Rate V
+
/2, 2.4 V/μs
V
OUT
= 2 V
PP
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T
J
> T
A
. Absolute maximum Ratings indicate junction temperature limits beyond which the
device maybe permanently degraded, either mechanically or electrically.
(2) All limits are specified by testing, statistical analysis or design.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4) Ambient production test is performed at 25°C with a variance of ±3°C.
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