Datasheet

LMP7721
SNOSAW6D –JANUARY 2008–REVISED MARCH 2013 www.ti.com
5V Electrical Characteristics
Unless otherwise specified, all limits are specified for T
A
= 25°C, V
+
= 5V, V
−
= 0V, V
CM
= (V
+
+ V
−
)/2. Boldface limits apply at
the temperature extremes.
Symbol Parameter Conditions Min Typ Max Units
(1) (2) (1)
V
OS
Input Offset Voltage ±26 ±150
μV
±450
TC V
OS
Input Offset Average Drift –1.5 –4 μV/°C
(3)
I
BIAS
Input Bias Current V
CM
= 1V 25°C ±3 ±20
fA
(4) (5)
−40°C to 85°C ±900
−40°C to 125°C ±5 pA
I
OS
Input Offset Current
(5)
6 40 fA
CMRR Common Mode Rejection Ratio 0V ≤ V
CM
≤ 3.7V 84 100
dB
82
PSRR Power Supply Rejection Ratio 1.8V ≤ V
+
≤ 5.5V 84 96
dB
V
−
= 0V, V
CM
= 0 80
CMVR Input Common-Mode Voltage CMRR ≥ 80 dB −0.3 4
V
Range CMRR ≥ 78 dB –0.3 4
A
VOL
Large Signal Voltage Gain V
O
= 0.3V to 4.7V 88 111
R
L
= 2 kΩ to V
+
/2 82
dB
V
O
= 0.3V to 4.7V 92 120
R
L
= 10 kΩ to V
+
/2 88
V
O
Output Swing High R
L
= 2 kΩ to V
+
/2 70 30
77
mV
from V
+
R
L
= 10 kΩ to V
+
/2 60 20
66
Output Swing Low R
L
= 2 kΩ to V
+
/2 31 70
73
mV
R
L
= 10 kΩ to V
+
/2 20 60
62
I
O
Output Short Circuit Current Sourcing to V
−
46 60
V
IN
= 200 mV
(6)
38
mA
Sinking to V
+
10.5 22
V
IN
= −200 mV
(6)
6.5
I
S
Supply Current 1.3 1.7
mA
1.95
SR Slew Rate A
V
= +1, Rising (10% to 90%) 10.43
V/μs
A
V
= +1, Falling (90% to 10%) 12.76
GBW Gain Bandwidth Product 17 MHz
e
n
Input-Referred Voltage Noise f = 400 Hz 7.5
nV/
f = 1 kHz 6.5
i
n
Input-Referred Current Noise f = 1 kHz 0.01
pA/
THD+N Total Harmonic Distortion + f = 1 kHz, A
V
= 2, R
L
= 100 kΩ 0.0007
Noise V
O
= 4 V
PP
%
f = 1 kHz, A
V
= 2, R
L
= 600Ω 0.0007
V
O
= 4 V
PP
(1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the
Statistical Quality Control (SQC) method.
(2) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(3) Offset voltage average drift is determined by dividing the change in V
OS
at the temperature extremes by the total temperature change.
(4) Positive current corresponds to current flowing into the device.
(5) This parameter is specified by design and/or characterization and is not tested in production.
(6) The short circuit test is a momentary open loop test.
4 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated
Product Folder Links: LMP7721