Datasheet

LMP7717, LMP7718
SNOSAY7H –MARCH 2007–REVISED MARCH 2013 www.ti.com
5V Electrical Characteristics
(1)
Unless otherwise specified, all limits are ensured for T
A
= 25°C, V
+
= 5V, V
−
= 0V, V
CM
= V
+
/2 = V
O
. Boldface limits apply at
the temperature extremes.
Symbo
Parameter Conditions Min
(2)
Typ
(3)
Max
(2)
Units
l
V
OS
Input Offset Voltage ±10 ±150
µV
±450
TC V
OS
Input Offset Voltage Temperature LMP7717 −1.0
±4 μV/°C
Drift
(4) (5)
LMP7718 −1.8
I
B
Input Bias Current V
CM
= 2.0V −40°C ≤ T
A
≤ 85°C 0.1 1
See
(6)
and
(5)
25
pA
−40°C ≤ T
A
≤ 125°C 0.1 1
100
I
OS
Input Offset Current V
CM
= 2.0V .01 0.5
pA
See
(5)
50
CMRR Common Mode Rejection Ratio 0V ≤ V
CM
≤ 3.7V 85 100
dB
80
PSRR Power Supply Rejection Ratio 2.0V ≤ V
+
≤ 5.5V, V
CM
= 0V 85 100
80
dB
1.8V ≤ V
+
≤ 5.5V, V
CM
= 0V 85 98
CMVR Common Mode Voltage Range CMRR ≥ 60 dB −0.3 4
V
CMRR ≥ 55 dB −0.3 4
A
VOL
Open Loop Voltage Gain V
OUT
= 0.3V to LMP7717 88 107
4.7V, 82
R
L
= 2 kΩ to V
+
/2
LMP7718 84 90
80
dB
V
OUT
= 0.3V to LMP7717 92 110
4.7V, 88
R
L
= 10 kΩ to V
+
/2
LMP7718 90 95
86
V
OUT
Output Voltage Swing High R
L
= 2 kΩ to V
+
/2 LMP7717 35 70
77
LMP7718 45 80
83
R
L
= 10 kΩ to V
+
/2 25 60
66
mV from
either rail
Output Voltage Swing Low R
L
= 2 kΩ to V
+
/2 LMP7717 42 70
73
LMP7718 45 80
83
R
L
= 10 kΩ to V
+
/2 25 60
66
I
OUT
Output Short Circuit Current Sourcing to V
−
46 60
V
IN
= 200 mV 38
See
(7)
mA
Sinking to V
+
10.5 21
V
IN
= –200 mV 6.5
See
(7)
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T
J
> T
A
.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the
statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(4) Offset voltage average drift is determined by dividing the change in V
OS
by temperature change.
(5) Parameter is specified by design and/or characterization and is not test in production.
(6) Positive current corresponds to current flowing into the device.
(7) The short circuit test is a momentary test, the short circuit duration is 1.5 ms.
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