Datasheet

LMP7717, LMP7718
SNOSAY7H –MARCH 2007–REVISED MARCH 2013 www.ti.com
2.5V Electrical Characteristics
(1)
Unless otherwise specified, all limits are ensured for T
A
= 25°C, V
+
= 2.5V, V
−
= 0V, V
CM
= V
+
/2 = V
O
. Boldface limits apply at
the temperature extremes.
Symbol Parameter Conditions Min
(2)
Typ
(3)
Max
(2)
Units
V
OS
Input Offset Voltage ±20 ±180
µV
±480
TC V
OS
Input Offset Voltage Temperature LMP7717 −1.0
±4 μV/°C
Drift
(4) (5)
LMP7718 −1.8
I
B
Input Bias Current V
CM
= 1.0V −40°C ≤ T
A
≤ 85°C 0.05 1
See
(6)
and
(5)
25
pA
−40°C ≤ T
A
≤ 0.05 1
125°C 100
I
OS
Input Offset Current V
CM
= 1.0V .006 0.5
pA
See
(5)
50
CMRR Common Mode Rejection Ratio 0V ≤ V
CM
≤ 1.4V 83 94
dB
80
PSRR Power Supply Rejection Ratio 2.0V ≤ V
+
≤ 5.5V, V
CM
= 0V 85 100
80
dB
1.8V ≤ V
+
≤ 5.5V, V
CM
= 0V 85 98
CMVR Common Mode Voltage Range CMRR ≥ 60 dB −0.3 1.5
V
CMRR ≥ 55 dB −0.3 1.5
A
VOL
Open Loop Voltage Gain V
OUT
= 0.15V to LMP7717 88 98
2.2V, 82
R
L
= 2 kΩ to V
+
/2
LMP7718 84 92
80
dB
V
OUT
= 0.15V to LMP7717 92 110
2.2V, 88
R
L
= 10 kΩ to V
+
/2
LMP7718 90 95
86
V
OUT
Output Voltage Swing High R
L
= 2 kΩ to V
+
/2 25 70
77
R
L
= 10 kΩ to V
+
/2 20 60
mV
66
from
either
Output Voltage Swing Low R
L
= 2 kΩ to V
+
/2 30 70
rail
73
R
L
= 10 kΩ to V
+
/2 15 60
62
I
OUT
Output Current Sourcing to V
−
36 47
V
IN
= 200 mV 30
See
(7)
mA
Sinking to V
+
7.5 15
V
IN
= –200 mV 5
See
(7)
I
S
Supply Current per Amplifier LMP7717 0.95 1.30
1.65
mA
LMP7718 per channel 1.1 1.5
1.85
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T
J
> T
A
.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the
statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(4) Offset voltage average drift is determined by dividing the change in V
OS
by temperature change.
(5) Parameter is specified by design and/or characterization and is not test in production.
(6) Positive current corresponds to current flowing into the device.
(7) The short circuit test is a momentary test, the short circuit duration is 1.5 ms.
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