Datasheet

LMP7711
www.ti.com SNOSAP4F –SEPTEMBER 2005–REVISED MAY 2013
2.5V ELECTRICAL CHARACTERISTICS
Unless otherwise noted, all limits are ensured for T
A
= 25°C, V
+
= 2.5V, V
−
= 0V ,V
O
= V
CM
= V
+
/2, V
EN
= V
+
. Boldface limits
apply at the temperature extremes.
Symbol Parameter Conditions Min
(1)
Typ
(2)
Max
(1)
Units
V
OS
Input Offset Voltage ±20 ±180
μV
±480
TC V
OS
Input Offset Voltage Temperature LMP7711
–1.75 –1 ±4 μV/°C
Drift
(3)(4)
LMP7712
I
B
Input Bias Current V
CM
= 1.0V
(5)(4)
−40°C ≤ TA ≤ 85°C 0.05 1
25
pA
−40°C ≤ TA ≤ 125°C 0.05 1
100
I
OS
Input Offset Current V
CM
= 1.0V
(4)
0.006 0.5
pA
50
CMRR Common Mode Rejection Ratio 0V ≤ V
CM
≤ 1.4V 83 100
dB
80
PSRR Power Supply Rejection Ratio 2.0V ≤ V
+
≤ 5.5V 85 100
V
−
= 0V, V
CM
= 0 80
dB
1.8V ≤ V
+
≤ 5.5V 85 98
V
−
= 0V, V
CM
= 0
CMVR Common Mode Voltage Range CMRR ≥ 80 dB −0.3 1.5
V
CMRR ≥ 78 dB –0.3 1.5
A
VOL
Open Loop Voltage Gain LMP7711, V
O
= 0.15 to 2.2V 88 98
R
L
= 2 kΩ to V
+
/2 82
LMP7712, V
O
= 0.15 to 2.2V 84 92
R
L
= 2 kΩ to V
+
/2 80
dB
LMP7711, V
O
= 0.15 to 2.2V 92 114
R
L
= 10 kΩ to V
+
/2 88
LMP7712, V
O
= 0.15 to 2.2V 90 95
R
L
= 10 kΩ to V
+
/2 86
V
OUT
Output Voltage Swing R
L
= 2 kΩ to V
+
/2 25 70
High 77
R
L
= 10 kΩ to V
+
/2 20 60 mV from
66 either rail
Output Voltage Swing R
L
= 2 kΩ to V
+
/2 30 70
Low 73
R
L
= 10 kΩ to V
+
/2 15 60
62
I
OUT
Output Current Sourcing to V
−
36 52
V
IN
= 200 mV
(6)
30
mA
Sinking to V
+
7.5 15
V
IN
= −200 mV
(6)
5.0
I
S
Supply Current LMP7711 0.95 1.30
Enable Mode V
EN
≥ 2.1 1.65
mA
LMP7712 (per channel) 1.10 1.50
Enable Mode V
EN
≥ 2.1 1.85
Shutdown Mode (per channel) 0.03 1
μA
V
EN
≤ 0.4 4
SR Slew Rate A
V
= +1, Rising (10% to 90%) 8.3
V/μs
A
V
= +1, Falling (90% to 10%) 10.3
(1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlations using the
Statistical Quality Control (SQC) method.
(2) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(3) Offset voltage average drift is determined by dividing the change in V
OS
at the temperature extremes by the total temperature change.
(4) This parameter is specified by design and/or characterization and is not tested in production.
(5) Positive current corresponds to current flowing into the device.
(6) The short circuit test is a momentary open loop test.
Copyright © 2005–2013, Texas Instruments Incorporated Submit Documentation Feedback 3
Product Folder Links: LMP7711