Datasheet

LMP7701, LMP7702, LMP7704
SNOSAI9H –SEPTEMBER 2005–REVISED MARCH 2013 www.ti.com
5V Electrical Characteristics
(1)
(continued)
Unless otherwise specified, all limits are ensured for T
A
= 25°C, V
+
= 5V, V
−
= 0V, V
CM
= V
+
/2, and R
L
> 10 kΩ to V
+
/2.
Boldface limits apply at the temperature extremes.
Parameter Test Conditions Min
(2)
Typ
(3)
Max
(2)
Units
I
OUT
Output Current
(6) (7)
Sourcing V
O
= V
+
/2 40 66
V
IN
= 100 mV (LMP7701) 28
Sourcing V
O
= V
+
/2 38 66
V
IN
= 100 mV (LMP7702/LMP7704) 25
mA
Sinking V
O
= V
+
/2 40 76
V
IN
= −100 mV (LMP7701) 28
Sinking V
O
= V
+
/2 40 76
V
IN
= −100 mV (LMP7702/LMP7704) 23
I
S
Supply Current LMP7701 0.715 1.0
1.2
LMP7702 1.5 1.9
mA
2.2
LMP7704 2.9 3.7
4.6
SR Slew Rate
(8)
A
V
= +1, V
O
= 4 V
PP
1.0
V/μs
10% to 90%
GBW Gain Bandwidth 2.5 MHz
THD+N Total Harmonic Distortion + Noise f = 1 kHz, A
V
= 1, R
L
= 10 kΩ 0.02 %
e
n
Input Referred Voltage Noise Density f = 1 kHz 9 nV/√Hz
i
n
Input Referred Current Noise Density f = 100 kHz 1 fA/√Hz
(6) The maximum power dissipation is a function of T
J(MAX)
, θ
JA
. The maximum allowable power dissipation at any ambient temperature is
P
D
= (T
J(MAX)
– T
A
)/ θ
JA
. All numbers apply for packages soldered directly onto a PC Board.
(7) The short circuit test is a momentary test.
(8) The number specified is the slower of positive and negative slew rates.
±5V Electrical Characteristics
(1)
Unless otherwise specified, all limits are ensured for T
A
= 25°C, V
+
= 5V, V
−
= −5V, V
CM
= 0V, and R
L
> 10 kΩ to 0V.
Boldface limits apply at the temperature extremes.
Parameter Test Conditions Min
(2)
Typ
(3)
Max
(2)
Units
V
OS
Input Offset Voltage LMP7701 ±37 ±200
±500
μV
LMP7702/LMP7704 ±37 ±220
±520
TCV
OS
Input Offset Voltage Temperature Drift
(4)
±1 ±5 μV/°C
I
B
Input Bias Current
(4) (5)
±0.2 1
−40°C ≤ T
A
≤ 85°C ±50
pA
(4) (5)
±0.2 1
−40°C ≤ T
A
≤ 125°C ±400
I
OS
Input Offset Current 40 fA
CMRR Common Mode Rejection Ratio −5V ≤ V
CM
≤ 5V 92 138
LMP7701 88
dB
−5V ≤ V
CM
≤ 5V 90 138
LMP7702/LMP7704 86
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T
J
> T
A
.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the
Statistical Quality Control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4) This parameter is specified by design and/or characterization and is not tested in production.
(5) Positive current corresponds to current flowing into the device.
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