Datasheet

LMP2234
www.ti.com SNOSAW4D –SEPTEMBER 2007–REVISED MARCH 2013
Operating Ratings
(1)
Operating Temperature Range
(2)
−40°C to 125°C
Supply Voltage (V
S
= V
+
- V
–
) 1.6V to 5.5V
Package Thermal Resistance (θ
JA
)
(2)
14-Pin SOIC 101.5 °C/W
14-Pin TSSOP 121 °C/W
(1) Absolute Maximum Ratings indicate limits beyond which damage may occur. Operating Ratings indicate conditions for which the device
is intended to be functional, but specific performance is not ensured. For ensured specifications and test conditions, see the Electrical
Characteristics.
(2) The maximum power dissipation is a function of T
J(MAX)
, θ
JA
. The maximum allowable power dissipation at any ambient temperature is
P
D
= (T
J(MAX)
– T
A
)/ θ
JA
. All numbers apply for packages soldered directly onto a PC Board.
5V DC Electrical Characteristics
(1)
Unless otherwise specified, all limits are ensured for T
A
= 25°C, V
+
= 5V, V
–
= 0V, V
CM
= V
O
= V
+
/2, and R
L
> 1 MΩ. Boldface
limits apply at the temperature extremes.
Symbol Parameter Conditions Min Typ Max Units
(2) (3) (2)
V
OS
Input Offset Voltage ±10 ±150 μV
±230
TCV
OS
Input Offset Voltage Drift LMP2234A ±0.3 ±0.75 μV/°C
LMP2234B ±0.3 ±2.5
I
BIAS
Input Bias Current ±0.02 ±1 pA
±50
I
OS
Input Offset Current ±5 fA
CMRR Common Mode Rejection Ratio 0V ≤ V
CM
≤ 4V 81 97 dB
80
PSRR Power Supply Rejection Ratio 1.6V ≤ V
+
≤ 5.5V 83 120 dB
V
CM
= 0V 82
CMVR Common Mode Voltage Range CMRR ≥ 80 dB −0.2 4.2 V
CMRR ≥ 79 dB −0.2 4.2
A
VOL
Large Signal Voltage Gain V
O
= 0.3V to 4.7V 110 120 dB
R
L
= 10 kΩ to V
+
/2 108
V
O
Output Swing High R
L
= 10 kΩ to V
+
/2 17 50 mV
V
IN
(diff) = 100 mV 50 from either
rail
Output Swing Low R
L
= 10 kΩ to V
+
/2 17 50
V
IN
(diff) = −100 mV 50
I
O
Output Current Sourcing, V
O
to V
−
27 30 mA
(4)
V
IN
(diff) = 100 mV 19
Sinking, V
O
to V
+
17 22
V
IN
(diff) = −100 mV 12
I
S
Supply Current 36 48 µA
50
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where T
J
> T
A
. Absolute Maximum Ratings indicate junction temperature limits beyond
which the device may be permanently degraded, either mechanically or electrically.
(2) All limits are specified by testing, statistical analysis or design.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4) The short circuit test is a momentary open loop test.
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