Datasheet

LMP2232
SNOSB02C –JANUARY 2008–REVISED MARCH 2013 www.ti.com
2.5V DC Electrical Characteristics
(1)
(continued)
Unless otherwise specified, all limits ensured for T
A
= 25°C, V
+
= 2.5V, V
−
= 0V, V
CM
= V
O
= V
+
/2, and R
L
> 1MΩ. Boldface
limits apply at the temperature extremes.
Symbol Parameter Conditions Min
(2)
Typ
(3)
Max
(2)
Units
PSRR Power Supply Rejection Ratio 1.6V ≤ V
+
≤ 5.5V 83 120
dB
V
–
= 0V, V
CM
= 0V 83
CMVR Common Mode Voltage Range CMRR ≥ 77 dB −0.2 1.7
V
CMRR ≥ 76 dB −0.2 1.7
A
VOL
Large Signal Voltage Gain V
O
= 0.3V to 2.2V 104 120
dB
R
L
= 10 kΩ to V
+
/2 104
V
O
Output Swing High R
L
= 10 kΩ to V
+
/2 12 50
mV
V
IN
(diff) = 100 mV 50
from either
Output Swing Low R
L
= 10 kΩ to V
+
/2 13 50
rail
V
IN
(diff) = –100 mV 50
I
O
Output Current
(4)
Sourcing, V
O
to V
–
5 8
V
IN
(diff) = 100 mV 4
mA
Sinking, V
O
to V
+
3.5 7
V
IN
(diff) = –100 mV 2.5
I
S
Supply Current 16 24
µA
25
(4) The short circuit test is a momentary open loop test.
2.5V AC Electrical Characteristics
(1)
Unless otherwise specified, all limits specified for T
A
= 25°C, V
+
= 2.5V, V
−
= 0V, V
CM
= V
O
= V
+
/2, and R
L
> 1MΩ. Boldface
limits apply at the temperature extremes.
Symbol Parameter Conditions Min
(2)
Typ
(3)
Max
(2)
Units
GBW Gain-Bandwidth Product C
L
= 20 pF, R
L
= 10 kΩ 128 kHz
SR Slew Rate A
V
= +1, C
L
= 20 pF Falling Edge 58
V/ms
R
L
= 10 kΩ
Rising Edge 48
θ
m
Phase Margin C
L
= 20 pF, R
L
= 10 kΩ 64 deg
G
m
Gain Margin C
L
= 20 pF, R
L
= 10 kΩ 26 dB
e
n
Input-Referred Voltage Noise Density f = 1 kHz 60 nV/√Hz
Input-Referred Voltage Noise 0.1 Hz to 10 Hz 2.5 μV
PP
i
n
Input-Referred Current Noise f = 1 kHz 10 fA/√Hz
THD+N Total Harmonic Distortion + Noise f = 100 Hz, R
L
= 10 kΩ 0.005 %
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T
J
> T
A
. Absolute Maximum Ratings indicate junction temperature limits beyond which the
device may be permanently degraded, either mechanically or electrically.
(2) All limits are specified by testing, statistical analysis or design.
(3) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and
will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production
material.
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